Synchrotron radiation experiments for phosphors radiation detectors

In this paper, the comparative performance of high-resolution phosphors using CCD (Charge Coupled Device) and CMOS (Complementary Metal Oxide Semiconductor) sensors for synchrotron radiation imaging is reported. Various phosphor films (ZnS [Cu, Al], ZnS [Ag, Al], Y2O2S [Tb], BiTiO3) are deposited on...

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Bibliographic Details
Main Authors: Kyoung-Jun Yoon, Ji-Koon Park, Sang-Sik Kang, Sung-Ho Cho, Jung-Wook Shin, Hyung-Won, Sang-Hee Nam
Format: Conference Proceeding
Language:English
Subjects:
Charge coupled devices
Charge-coupled image sensors
CMOS image sensors
Glass
High-resolution imaging
Phosphors
Radiation detectors
Semiconductor films
Synchrotron radiation
Zinc compounds
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Summary:In this paper, the comparative performance of high-resolution phosphors using CCD (Charge Coupled Device) and CMOS (Complementary Metal Oxide Semiconductor) sensors for synchrotron radiation imaging is reported. Various phosphor films (ZnS [Cu, Al], ZnS [Ag, Al], Y2O2S [Tb], BiTiO3) are deposited on glass substrates using printing techniques. The phosphor plates used were 5 /spl mu/m, 10 /spl mu/m, 15 /spl mu/m, and 20 /spl mu/m thick, respectively. To investigate the luminescent properties of phosphor plates, the excitation and photoluminescence spectra were measured. The 20 line-pair test pattern images were obtained and evaluated by calculating the modulation transfer function (MTF). From the experimental results, it was concluded that the thicker the phosphor plates, the better the luminescent efficiency of X-ray-induced light photons. The phosphor thickness, however, decreases the MTF due to light blurring. ZnS (Cu, Al) phosphor of 15 /spl mu/m thickness had a maximum value of 0.8 at 5 lp/mm.
DOI:10.1109/HEALTH.2005.1500480