Technology of the Diode Programmable Read Only Memory

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Bibliographic Details
Main Authors: Lifka, H., Woerlee, P.H., de Graaf, C., Hart, C.M., Janssen, P.J.M., Paulzen, G.M., Theunissen, M.J.J., de Vreede, P.W.H.
Format: Conference Proceeding
Language:English
Subjects:
Diodes
Electric breakdown
Isolation technology
Laboratories
MOS devices
MOSFETs
PROM
Read only memory
Stress
Voltage
Online Access:Request full text
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DOI:10.1109/ESSDERC.1997.194418