Production planning with joint resources usage semiconductor test manufacturing

A tester and qualified kits are used simultaneously to test a semiconductor product. One kit consists of six or seven components. Production planning in semiconductor testing is complex due to dependant resources requirement and intricate {product, tester, kit, component} qualification relationships...

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Bibliographic Details
Main Authors: Zhi-Cong Zhang, Mike Tao Zhang, Niu, S., Li Zheng
Format: Conference Proceeding
Language:English
Subjects:
Aggregates
Capacity planning
Fabrication
Job shop scheduling
Linear programming
Predictive models
Production planning
Semiconductor device manufacture
Semiconductor device modeling
Semiconductor device testing
Online Access:Request full text
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Description
Summary:A tester and qualified kits are used simultaneously to test a semiconductor product. One kit consists of six or seven components. Production planning in semiconductor testing is complex due to dependant resources requirement and intricate {product, tester, kit, component} qualification relationships. We formulate a multi-period production planning problem employing mixed integer programming (MIP) technique. We consider multiple matching ratios of jointly used testers and kits, allow kit reconfiguration and optimize capacity allocation at the level of kit components. We also conduct weight coefficient analysis to enable multiobjective optimization. Industrial implementation saves millions of dollars in kit purchasing and many man-hours.
ISSN:2161-8070
2161-8089
DOI:10.1109/COASE.2005.1506744