New multimodel aggressive space mapping technique for the efficient design of complex microwave circuits

The well known aggressive space mapping technique has been widely used for the design of complex microwave circuits. Many extensions of ASM have been developed in recent times. These methods improve ASM either at the cost of increasing the number of fine model evaluations, or at the cost of decreasi...

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Main Authors: Morro, J.V., Esteban, H., Boria, V.E., Bachiller, C., Coves, A.
Format: Conference Proceeding
Language:English
Subjects:
Computational modeling
Costs
Die casting
Filters
Microwave circuits
Microwave theory and techniques
Parameter extraction
Process design
Robustness
Testing
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Esteban, H.
Boria, V.E.
Bachiller, C.
Coves, A.
description The well known aggressive space mapping technique has been widely used for the design of complex microwave circuits. Many extensions of ASM have been developed in recent times. These methods improve ASM either at the cost of increasing the number of fine model evaluations, or at the cost of decreasing the accuracy of the fine model. In this work, we present a new extension of ASM, the multimodel ASM (MASM) that uses several fine models of increasing accuracy. Following an iterative procedure, it gradually maps the coarse and the finest model, thus reducing the risk of divergence, and improving the overall efficiency and robustness of the design process, without reducing the accuracy of the results. The new MASM has been tested with the design of a six-pole H plane coupled cavities filter with rounded corners in the coupling windows due to die casting fabrication.
doi_str_mv 10.1109/MWSYM.2005.1517013
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fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_1517013</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1517013</ieee_id><sourcerecordid>1517013</sourcerecordid><originalsourceid>FETCH-LOGICAL-i175t-b24e891897e68e5d3f551f0f35ec4b848b99f9b7311d3b91e319360085afdd613</originalsourceid><addsrcrecordid>eNotkMlOwzAURS0Giar0B2DjH0jxi-3YXqKKSWphAQhYVY7znBhlIk4p_D2R6NWRzu4sLiEXwJYAzFxt3p4_NsuUMbkECYoBPyKzVKosUSlkx2RhlGYTXGsh4YTMGAiTZEK-n5FFjJ9smpBcgZyR6hH3tNnVY2i6Amtqy3LAGMM30thbh7SxfR_ako7oqjZ87ZD6bqBjhRS9Dy5gO9ICYyhb2nnquqav8Yc2wQ3d3k4VFwa3C2M8J6fe1hEXB8_J6-3Ny-o-WT_dPayu10kAJcckTwVqA9oozDTKgnspwTPPJTqRa6FzY7zJFQcoeG4AORieMaal9UWRAZ-Ty_9uQMRtP4TGDr_bw0_8D-5wW8k</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>New multimodel aggressive space mapping technique for the efficient design of complex microwave circuits</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Morro, J.V. ; Esteban, H. ; Boria, V.E. ; Bachiller, C. ; Coves, A.</creator><creatorcontrib>Morro, J.V. ; Esteban, H. ; Boria, V.E. ; Bachiller, C. ; Coves, A.</creatorcontrib><description>The well known aggressive space mapping technique has been widely used for the design of complex microwave circuits. Many extensions of ASM have been developed in recent times. These methods improve ASM either at the cost of increasing the number of fine model evaluations, or at the cost of decreasing the accuracy of the fine model. In this work, we present a new extension of ASM, the multimodel ASM (MASM) that uses several fine models of increasing accuracy. Following an iterative procedure, it gradually maps the coarse and the finest model, thus reducing the risk of divergence, and improving the overall efficiency and robustness of the design process, without reducing the accuracy of the results. The new MASM has been tested with the design of a six-pole H plane coupled cavities filter with rounded corners in the coupling windows due to die casting fabrication.</description><identifier>ISSN: 0149-645X</identifier><identifier>ISBN: 9780780388451</identifier><identifier>ISBN: 0780388453</identifier><identifier>EISSN: 2576-7216</identifier><identifier>DOI: 10.1109/MWSYM.2005.1517013</identifier><language>eng</language><publisher>IEEE</publisher><subject>Computational modeling ; Costs ; Die casting ; Filters ; Microwave circuits ; Microwave theory and techniques ; Parameter extraction ; Process design ; Robustness ; Testing</subject><ispartof>IEEE MTT-S International Microwave Symposium Digest, 2005, 2005, p.1613-1616</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1517013$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54555,54920,54932</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1517013$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Morro, J.V.</creatorcontrib><creatorcontrib>Esteban, H.</creatorcontrib><creatorcontrib>Boria, V.E.</creatorcontrib><creatorcontrib>Bachiller, C.</creatorcontrib><creatorcontrib>Coves, A.</creatorcontrib><title>New multimodel aggressive space mapping technique for the efficient design of complex microwave circuits</title><title>IEEE MTT-S International Microwave Symposium Digest, 2005</title><addtitle>MWSYM</addtitle><description>The well known aggressive space mapping technique has been widely used for the design of complex microwave circuits. Many extensions of ASM have been developed in recent times. These methods improve ASM either at the cost of increasing the number of fine model evaluations, or at the cost of decreasing the accuracy of the fine model. In this work, we present a new extension of ASM, the multimodel ASM (MASM) that uses several fine models of increasing accuracy. Following an iterative procedure, it gradually maps the coarse and the finest model, thus reducing the risk of divergence, and improving the overall efficiency and robustness of the design process, without reducing the accuracy of the results. The new MASM has been tested with the design of a six-pole H plane coupled cavities filter with rounded corners in the coupling windows due to die casting fabrication.</description><subject>Computational modeling</subject><subject>Costs</subject><subject>Die casting</subject><subject>Filters</subject><subject>Microwave circuits</subject><subject>Microwave theory and techniques</subject><subject>Parameter extraction</subject><subject>Process design</subject><subject>Robustness</subject><subject>Testing</subject><issn>0149-645X</issn><issn>2576-7216</issn><isbn>9780780388451</isbn><isbn>0780388453</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2005</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotkMlOwzAURS0Giar0B2DjH0jxi-3YXqKKSWphAQhYVY7znBhlIk4p_D2R6NWRzu4sLiEXwJYAzFxt3p4_NsuUMbkECYoBPyKzVKosUSlkx2RhlGYTXGsh4YTMGAiTZEK-n5FFjJ9smpBcgZyR6hH3tNnVY2i6Amtqy3LAGMM30thbh7SxfR_ako7oqjZ87ZD6bqBjhRS9Dy5gO9ICYyhb2nnquqav8Yc2wQ3d3k4VFwa3C2M8J6fe1hEXB8_J6-3Ny-o-WT_dPayu10kAJcckTwVqA9oozDTKgnspwTPPJTqRa6FzY7zJFQcoeG4AORieMaal9UWRAZ-Ty_9uQMRtP4TGDr_bw0_8D-5wW8k</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>Morro, J.V.</creator><creator>Esteban, H.</creator><creator>Boria, V.E.</creator><creator>Bachiller, C.</creator><creator>Coves, A.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2005</creationdate><title>New multimodel aggressive space mapping technique for the efficient design of complex microwave circuits</title><author>Morro, J.V. ; Esteban, H. ; Boria, V.E. ; Bachiller, C. ; Coves, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-b24e891897e68e5d3f551f0f35ec4b848b99f9b7311d3b91e319360085afdd613</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Computational modeling</topic><topic>Costs</topic><topic>Die casting</topic><topic>Filters</topic><topic>Microwave circuits</topic><topic>Microwave theory and techniques</topic><topic>Parameter extraction</topic><topic>Process design</topic><topic>Robustness</topic><topic>Testing</topic><toplevel>online_resources</toplevel><creatorcontrib>Morro, J.V.</creatorcontrib><creatorcontrib>Esteban, H.</creatorcontrib><creatorcontrib>Boria, V.E.</creatorcontrib><creatorcontrib>Bachiller, C.</creatorcontrib><creatorcontrib>Coves, A.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Morro, J.V.</au><au>Esteban, H.</au><au>Boria, V.E.</au><au>Bachiller, C.</au><au>Coves, A.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>New multimodel aggressive space mapping technique for the efficient design of complex microwave circuits</atitle><btitle>IEEE MTT-S International Microwave Symposium Digest, 2005</btitle><stitle>MWSYM</stitle><date>2005</date><risdate>2005</risdate><spage>1613</spage><epage>1616</epage><pages>1613-1616</pages><issn>0149-645X</issn><eissn>2576-7216</eissn><isbn>9780780388451</isbn><isbn>0780388453</isbn><abstract>The well known aggressive space mapping technique has been widely used for the design of complex microwave circuits. Many extensions of ASM have been developed in recent times. These methods improve ASM either at the cost of increasing the number of fine model evaluations, or at the cost of decreasing the accuracy of the fine model. In this work, we present a new extension of ASM, the multimodel ASM (MASM) that uses several fine models of increasing accuracy. Following an iterative procedure, it gradually maps the coarse and the finest model, thus reducing the risk of divergence, and improving the overall efficiency and robustness of the design process, without reducing the accuracy of the results. The new MASM has been tested with the design of a six-pole H plane coupled cavities filter with rounded corners in the coupling windows due to die casting fabrication.</abstract><pub>IEEE</pub><doi>10.1109/MWSYM.2005.1517013</doi><tpages>4</tpages></addata></record>
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subjects Computational modeling
Costs
Die casting
Filters
Microwave circuits
Microwave theory and techniques
Parameter extraction
Process design
Robustness
Testing
title New multimodel aggressive space mapping technique for the efficient design of complex microwave circuits
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T08%3A50%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=New%20multimodel%20aggressive%20space%20mapping%20technique%20for%20the%20efficient%20design%20of%20complex%20microwave%20circuits&rft.btitle=IEEE%20MTT-S%20International%20Microwave%20Symposium%20Digest,%202005&rft.au=Morro,%20J.V.&rft.date=2005&rft.spage=1613&rft.epage=1616&rft.pages=1613-1616&rft.issn=0149-645X&rft.eissn=2576-7216&rft.isbn=9780780388451&rft.isbn_list=0780388453&rft_id=info:doi/10.1109/MWSYM.2005.1517013&rft_dat=%3Cieee_6IE%3E1517013%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i175t-b24e891897e68e5d3f551f0f35ec4b848b99f9b7311d3b91e319360085afdd613%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1517013&rfr_iscdi=true