Validation and testing of design hardening for single event effects using the 8051 microcontroller

With the dearth of dedicated radiation hardened foundries, new and novel techniques are being developed for hardening designs using nondedicated foundry services. In this paper, we discuss the implications of validating these methods for the single event effects (SEE) in the space environment. Topic...

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Bibliographic Details
Main Authors: Howard, J.W., LaBel, K.A., Carts, M.A., Seidleck, C., Gambles, J.W., Ruggles, S.L.
Format: Conference Proceeding
Language:English
Subjects:
Design engineering
Foundries
Libraries
Microcontrollers
Microelectronics
NASA
Qualifications
Radiation hardening
Space technology
Testing
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Summary:With the dearth of dedicated radiation hardened foundries, new and novel techniques are being developed for hardening designs using nondedicated foundry services. In this paper, we discuss the implications of validating these methods for the single event effects (SEE) in the space environment. Topics include the types of tests that are required and the design coverage (i.e., design libraries: do they need validating for each application?). Finally, an 8051 microcontroller core from NASA Institute of Advanced Microelectronics (IA/spl mu/E) CMOS ultra low power radiation tolerant (CULPRiT) design is evaluated for SEE mitigative techniques against two commercial 8051 devices.
ISSN:2154-0519
2154-0535
DOI:10.1109/REDW.2005.1532671