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Nanoscale selective area epitaxy: towards lithographically defined quantum dots at 1.5 /spl mu/m using direct lithographic patterning

InP/InGaAs/InP heterostructures were selectively grown in an array of 60 nm holes on a 90 nm pitch by MOCVD. The pattern was defined photolithographically directly in hydrogen silsesquioxane, a spin-on-glass, obviating the need for pattern transfer processes.

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Main Authors: Swint, R.B., Juodawlkis, P.W., Oakley, D.C., Napoleone, A., Vineis, C.J., Chludzinski, J.W., Turner, G.W., Twichell, J.C., Bloomstein, T.M., Cann, S.G., Efremow, N.N., Hardy, D.E., Marchant, M.F., Rothschild, M.
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creator Swint, R.B.
Juodawlkis, P.W.
Oakley, D.C.
Napoleone, A.
Vineis, C.J.
Chludzinski, J.W.
Turner, G.W.
Twichell, J.C.
Bloomstein, T.M.
Cann, S.G.
Efremow, N.N.
Hardy, D.E.
Marchant, M.F.
Rothschild, M.
description InP/InGaAs/InP heterostructures were selectively grown in an array of 60 nm holes on a 90 nm pitch by MOCVD. The pattern was defined photolithographically directly in hydrogen silsesquioxane, a spin-on-glass, obviating the need for pattern transfer processes.
doi_str_mv 10.1109/LEOS.2005.1548307
format conference_proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_1548307</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>1548307</ieee_id><sourcerecordid>1548307</sourcerecordid><originalsourceid>FETCH-ieee_primary_15483073</originalsourceid><addsrcrecordid>eNp9j71OwzAUhS1-JFLgARDLfYEk1w6pU1ZU1AHB0O7VVXPbGjmOsR0gD8B7k6ELC9MZvnM-6QhxJ7GQEhfly_JtXSjEupD1Q1OhPhOZ0vN5LnVVnYsZ6garhZK6vhDZNFB5g428ErMY3xEVKq0z8fNKro87sgyRLe-S-WSgwATsTaLv8RFS_0WhjWBNOvaHQP5opr4doeW9cdzCx0AuDR20fYpACWRRQxm9hW4oOxiicQdoTZjkfxzgKSUObsI34nJPNvLtKa_F_fNy87TKDTNvfTAdhXF7uln9T38BEypV3A</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Nanoscale selective area epitaxy: towards lithographically defined quantum dots at 1.5 /spl mu/m using direct lithographic patterning</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Swint, R.B. ; Juodawlkis, P.W. ; Oakley, D.C. ; Napoleone, A. ; Vineis, C.J. ; Chludzinski, J.W. ; Turner, G.W. ; Twichell, J.C. ; Bloomstein, T.M. ; Cann, S.G. ; Efremow, N.N. ; Hardy, D.E. ; Marchant, M.F. ; Rothschild, M.</creator><creatorcontrib>Swint, R.B. ; Juodawlkis, P.W. ; Oakley, D.C. ; Napoleone, A. ; Vineis, C.J. ; Chludzinski, J.W. ; Turner, G.W. ; Twichell, J.C. ; Bloomstein, T.M. ; Cann, S.G. ; Efremow, N.N. ; Hardy, D.E. ; Marchant, M.F. ; Rothschild, M.</creatorcontrib><description>InP/InGaAs/InP heterostructures were selectively grown in an array of 60 nm holes on a 90 nm pitch by MOCVD. The pattern was defined photolithographically directly in hydrogen silsesquioxane, a spin-on-glass, obviating the need for pattern transfer processes.</description><identifier>ISSN: 1092-8081</identifier><identifier>ISBN: 0780392175</identifier><identifier>ISBN: 9780780392175</identifier><identifier>EISSN: 2766-1733</identifier><identifier>DOI: 10.1109/LEOS.2005.1548307</identifier><language>eng</language><publisher>IEEE</publisher><subject>Crystallography ; Epitaxial growth ; Hydrogen ; Indium gallium arsenide ; Indium phosphide ; Interference ; Lithography ; MOCVD ; Quantum dots ; Resists</subject><ispartof>2005 IEEE LEOS Annual Meeting Conference Proceedings, 2005, p.913-914</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/1548307$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,777,781,786,787,2052,4036,4037,27906,54901</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/1548307$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Swint, R.B.</creatorcontrib><creatorcontrib>Juodawlkis, P.W.</creatorcontrib><creatorcontrib>Oakley, D.C.</creatorcontrib><creatorcontrib>Napoleone, A.</creatorcontrib><creatorcontrib>Vineis, C.J.</creatorcontrib><creatorcontrib>Chludzinski, J.W.</creatorcontrib><creatorcontrib>Turner, G.W.</creatorcontrib><creatorcontrib>Twichell, J.C.</creatorcontrib><creatorcontrib>Bloomstein, T.M.</creatorcontrib><creatorcontrib>Cann, S.G.</creatorcontrib><creatorcontrib>Efremow, N.N.</creatorcontrib><creatorcontrib>Hardy, D.E.</creatorcontrib><creatorcontrib>Marchant, M.F.</creatorcontrib><creatorcontrib>Rothschild, M.</creatorcontrib><title>Nanoscale selective area epitaxy: towards lithographically defined quantum dots at 1.5 /spl mu/m using direct lithographic patterning</title><title>2005 IEEE LEOS Annual Meeting Conference Proceedings</title><addtitle>LEOS</addtitle><description>InP/InGaAs/InP heterostructures were selectively grown in an array of 60 nm holes on a 90 nm pitch by MOCVD. The pattern was defined photolithographically directly in hydrogen silsesquioxane, a spin-on-glass, obviating the need for pattern transfer processes.</description><subject>Crystallography</subject><subject>Epitaxial growth</subject><subject>Hydrogen</subject><subject>Indium gallium arsenide</subject><subject>Indium phosphide</subject><subject>Interference</subject><subject>Lithography</subject><subject>MOCVD</subject><subject>Quantum dots</subject><subject>Resists</subject><issn>1092-8081</issn><issn>2766-1733</issn><isbn>0780392175</isbn><isbn>9780780392175</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2005</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNp9j71OwzAUhS1-JFLgARDLfYEk1w6pU1ZU1AHB0O7VVXPbGjmOsR0gD8B7k6ELC9MZvnM-6QhxJ7GQEhfly_JtXSjEupD1Q1OhPhOZ0vN5LnVVnYsZ6garhZK6vhDZNFB5g428ErMY3xEVKq0z8fNKro87sgyRLe-S-WSgwATsTaLv8RFS_0WhjWBNOvaHQP5opr4doeW9cdzCx0AuDR20fYpACWRRQxm9hW4oOxiicQdoTZjkfxzgKSUObsI34nJPNvLtKa_F_fNy87TKDTNvfTAdhXF7uln9T38BEypV3A</recordid><startdate>2005</startdate><enddate>2005</enddate><creator>Swint, R.B.</creator><creator>Juodawlkis, P.W.</creator><creator>Oakley, D.C.</creator><creator>Napoleone, A.</creator><creator>Vineis, C.J.</creator><creator>Chludzinski, J.W.</creator><creator>Turner, G.W.</creator><creator>Twichell, J.C.</creator><creator>Bloomstein, T.M.</creator><creator>Cann, S.G.</creator><creator>Efremow, N.N.</creator><creator>Hardy, D.E.</creator><creator>Marchant, M.F.</creator><creator>Rothschild, M.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>2005</creationdate><title>Nanoscale selective area epitaxy: towards lithographically defined quantum dots at 1.5 /spl mu/m using direct lithographic patterning</title><author>Swint, R.B. ; Juodawlkis, P.W. ; Oakley, D.C. ; Napoleone, A. ; Vineis, C.J. ; Chludzinski, J.W. ; Turner, G.W. ; Twichell, J.C. ; Bloomstein, T.M. ; Cann, S.G. ; Efremow, N.N. ; Hardy, D.E. ; Marchant, M.F. ; Rothschild, M.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_15483073</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2005</creationdate><topic>Crystallography</topic><topic>Epitaxial growth</topic><topic>Hydrogen</topic><topic>Indium gallium arsenide</topic><topic>Indium phosphide</topic><topic>Interference</topic><topic>Lithography</topic><topic>MOCVD</topic><topic>Quantum dots</topic><topic>Resists</topic><toplevel>online_resources</toplevel><creatorcontrib>Swint, R.B.</creatorcontrib><creatorcontrib>Juodawlkis, P.W.</creatorcontrib><creatorcontrib>Oakley, D.C.</creatorcontrib><creatorcontrib>Napoleone, A.</creatorcontrib><creatorcontrib>Vineis, C.J.</creatorcontrib><creatorcontrib>Chludzinski, J.W.</creatorcontrib><creatorcontrib>Turner, G.W.</creatorcontrib><creatorcontrib>Twichell, J.C.</creatorcontrib><creatorcontrib>Bloomstein, T.M.</creatorcontrib><creatorcontrib>Cann, S.G.</creatorcontrib><creatorcontrib>Efremow, N.N.</creatorcontrib><creatorcontrib>Hardy, D.E.</creatorcontrib><creatorcontrib>Marchant, M.F.</creatorcontrib><creatorcontrib>Rothschild, M.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Swint, R.B.</au><au>Juodawlkis, P.W.</au><au>Oakley, D.C.</au><au>Napoleone, A.</au><au>Vineis, C.J.</au><au>Chludzinski, J.W.</au><au>Turner, G.W.</au><au>Twichell, J.C.</au><au>Bloomstein, T.M.</au><au>Cann, S.G.</au><au>Efremow, N.N.</au><au>Hardy, D.E.</au><au>Marchant, M.F.</au><au>Rothschild, M.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Nanoscale selective area epitaxy: towards lithographically defined quantum dots at 1.5 /spl mu/m using direct lithographic patterning</atitle><btitle>2005 IEEE LEOS Annual Meeting Conference Proceedings</btitle><stitle>LEOS</stitle><date>2005</date><risdate>2005</risdate><spage>913</spage><epage>914</epage><pages>913-914</pages><issn>1092-8081</issn><eissn>2766-1733</eissn><isbn>0780392175</isbn><isbn>9780780392175</isbn><abstract>InP/InGaAs/InP heterostructures were selectively grown in an array of 60 nm holes on a 90 nm pitch by MOCVD. The pattern was defined photolithographically directly in hydrogen silsesquioxane, a spin-on-glass, obviating the need for pattern transfer processes.</abstract><pub>IEEE</pub><doi>10.1109/LEOS.2005.1548307</doi></addata></record>
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identifier ISSN: 1092-8081
ispartof 2005 IEEE LEOS Annual Meeting Conference Proceedings, 2005, p.913-914
issn 1092-8081
2766-1733
language eng
recordid cdi_ieee_primary_1548307
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Crystallography
Epitaxial growth
Hydrogen
Indium gallium arsenide
Indium phosphide
Interference
Lithography
MOCVD
Quantum dots
Resists
title Nanoscale selective area epitaxy: towards lithographically defined quantum dots at 1.5 /spl mu/m using direct lithographic patterning
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-20T02%3A52%3A38IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Nanoscale%20selective%20area%20epitaxy:%20towards%20lithographically%20defined%20quantum%20dots%20at%201.5%20/spl%20mu/m%20using%20direct%20lithographic%20patterning&rft.btitle=2005%20IEEE%20LEOS%20Annual%20Meeting%20Conference%20Proceedings&rft.au=Swint,%20R.B.&rft.date=2005&rft.spage=913&rft.epage=914&rft.pages=913-914&rft.issn=1092-8081&rft.eissn=2766-1733&rft.isbn=0780392175&rft.isbn_list=9780780392175&rft_id=info:doi/10.1109/LEOS.2005.1548307&rft_dat=%3Cieee_6IE%3E1548307%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-ieee_primary_15483073%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=1548307&rfr_iscdi=true