SPICE simulations and circuit tests of digital noise reduction with MEMS inductors

Digital-noise reduction with decoupling capacitors in ever faster lower voltage technologies is gradually rendered ineffective by the line resistance to the capacitors. In contrast, blocking inductors show excellent noise reduction in SPICE simulations, the LdI/dt self-perturbance being solved with...

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Bibliographic Details
Main Authors: Dima, M.O., Becks, K.H.
Format: Conference Proceeding
Language:English
Subjects:
Capacitors
Circuit noise
Circuit simulation
Circuit testing
Inductors
Microelectronics
Micromechanical devices
Noise reduction
SPICE
Voltage
Online Access:Request full text
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Description
Summary:Digital-noise reduction with decoupling capacitors in ever faster lower voltage technologies is gradually rendered ineffective by the line resistance to the capacitors. In contrast, blocking inductors show excellent noise reduction in SPICE simulations, the LdI/dt self-perturbance being solved with local auxiliary capacitors. The needed values for both inductances and capacitances are small, allowing their implementation in MCM (multi-chip module), or alternative, technologies. Circuit tests confirm the SPICE simulations
ISSN:1545-827X
2377-0678
DOI:10.1109/SMICND.2005.1558822