Enhanced write performance of a 64-mb phase-change random access memory
The write performance of the 1.8-V 64-Mb phase-change random access memory (PRAM) has been improved, which was developed based on 0.12-/spl mu/m CMOS technology. For the improvement of RESET and SET distributions, a cell current regulator scheme and multiple step-down pulse generator were employed,...
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Published in: | IEEE journal of solid-state circuits 2006-01, Vol.41 (1), p.122-126 |
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Main Authors: | , , , , , , , , , , , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The write performance of the 1.8-V 64-Mb phase-change random access memory (PRAM) has been improved, which was developed based on 0.12-/spl mu/m CMOS technology. For the improvement of RESET and SET distributions, a cell current regulator scheme and multiple step-down pulse generator were employed, respectively. The read access time and SET write time are 68 ns and 180 ns, respectively. |
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ISSN: | 0018-9200 1558-173X |
DOI: | 10.1109/JSSC.2005.859016 |