Probing electrical signals in silicon CMOS devices using electric field induced second harmonic generation

We report the use of electric-field-induced second-harmonic generation to investigate the electrical signal in CMOS chips with 2.3/spl mu/m femtosecond pulses. A linear relationship between the signal and applied voltage is found for voltages

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Bibliographic Details
Main Authors: Dong Xiao, Ramsay, E., Reid, D.T., Offenbeck, B., Sundermeyer, J., Seemann, K., Weber, N.
Format: Conference Proceeding
Language:English
Subjects:
Frequency conversion
Nonlinear optical devices
Nonlinear optics
Optical filters
Optical harmonic generation
Optical pulse generation
Photodiodes
Silicon
Ultrafast optics
Voltage
Online Access:Request full text
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Description
Summary:We report the use of electric-field-induced second-harmonic generation to investigate the electrical signal in CMOS chips with 2.3/spl mu/m femtosecond pulses. A linear relationship between the signal and applied voltage is found for voltages
DOI:10.1109/CLEOE.2005.1568025