Improved Reflection-Method for Refractive Index Measurements of Optical Waveguides

An improved technique for measuring the refractive index profile of optical waveguides using a modified confocal scanning optical microscope with a stable light source, a low signal system, and a simple feedback scheme is described.

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Bibliographic Details
Main Authors: Youk, Y., Dug Young Kim
Format: Conference Proceeding
Language:English
Subjects:
Optical feedback
Optical fibers
Optical interferometry
Optical microscopy
Optical refraction
Optical sensors
Optical signal processing
Optical variables control
Optical waveguides
Refractive index
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Description
Summary:An improved technique for measuring the refractive index profile of optical waveguides using a modified confocal scanning optical microscope with a stable light source, a low signal system, and a simple feedback scheme is described.
DOI:10.1109/CLEOPR.2005.1569622