Microprocessor silicon debug based on failure propagation tracing

As the complexity of microprocessors increases, the design and bring-up times have significantly increased, negatively impacting the time-to-market (TTM) requirements. In this paper, a backtracing methodology for identifying the root cause of functional failures on the UltraSPARCtrade family of proc...

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Bibliographic Details
Main Authors: Caty, O., Dahlgren, P., Bayraktaroglu, I.
Format: Conference Proceeding
Language:English
Subjects:
Clocks
Frequency
Logic devices
Logic testing
Manufacturing
Microprocessors
Silicon
Sun
Timing
Voltage
Online Access:Request full text
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Summary:As the complexity of microprocessors increases, the design and bring-up times have significantly increased, negatively impacting the time-to-market (TTM) requirements. In this paper, a backtracing methodology for identifying the root cause of functional failures on the UltraSPARCtrade family of processors is presented. Data provided by a scan dump analysis methodology is linked not only to the design database but also to the failing test in order to isolate one or several candidates for further analysis
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2005.1583986