A vector-based approach for power supply noise analysis in test compaction

Excessive power supply noise can lead to overkill during delay test. A static test vector compaction solution is described to prevent such overkill. Low-cost power supply noise models are developed and used in compaction. An error analysis of these models is given. This paper improves on prior work...

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Bibliographic Details
Main Authors: Jing Wang, Ziding Yue, Xiang Lu, Wangqi Qiu, Weiping Shi, Walker, D.M.H.
Format: Conference Proceeding
Language:English
Subjects:
Circuit faults
Circuit noise
Circuit testing
Compaction
Crosstalk
Delay
Noise level
Power supplies
Semiconductor device noise
Timing
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Description
Summary:Excessive power supply noise can lead to overkill during delay test. A static test vector compaction solution is described to prevent such overkill. Low-cost power supply noise models are developed and used in compaction. An error analysis of these models is given. This paper improves on prior work in terms of models and algorithm to increase accuracy and performance. Experimental results are given on ISCAS89 circuits
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2005.1584012