Efficient compression of deterministic patterns into multiple PRPG seeds

Recent test-cost reduction methods are based on controlling the initial state (seed) of a pseudo-random pattern generator (PRPG) so that deterministic values are loaded in selected scan cells. Combined with an unload-data compression technique, PRPG seeding reduces test data volume and application t...

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Bibliographic Details
Main Authors: Wohl, P., Waicukauski, J.A., Patel, S., DaSilva, F., Williams, T.W., Kapur, R.
Format: Conference Proceeding
Language:English
Subjects:
Automatic test pattern generation
Built-in self-test
Circuit faults
Circuit testing
Clocks
Codecs
Costs
Delay
Merging
Wiring
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Description
Summary:Recent test-cost reduction methods are based on controlling the initial state (seed) of a pseudo-random pattern generator (PRPG) so that deterministic values are loaded in selected scan cells. Combined with an unload-data compression technique, PRPG seeding reduces test data volume and application time. This paper presents a method of mapping each scan load to multiple PRPG seeds, computed so that test pattern count, data volume, and, therefore, test cost are minimized. This method also allows smaller and fewer PRPGs, reducing the area overhead of test-compression circuitry. The results on deep-submicron industrial designs, show significant test cost reduction when this method is applied with either X-tolerant or X-free unload-data compression
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2005.1584057