A new probing technique for high-speed/high-density printed circuit boards

Bullock, in 1987 [Bull87] provided design-for-test (DFT) rules for probing printed circuit boards for in-circuit testing. Many of these rules stand in good stead even today. However, recent technical advances in operational board speed are leading some to believe that in-circuit testing cannot be pe...

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Bibliographic Details
Main Author: Parker, K.P.
Format: Conference Proceeding
Language:English
Subjects:
Circuit testing
Design for testability
Electronic equipment testing
Fixtures
Logic testing
Performance evaluation
Pins
Printed circuits
Probes
Switches
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Description
Summary:Bullock, in 1987 [Bull87] provided design-for-test (DFT) rules for probing printed circuit boards for in-circuit testing. Many of these rules stand in good stead even today. However, recent technical advances in operational board speed are leading some to believe that in-circuit testing cannot be performed on the high-speed sectors of boards soon to be designed. Due to the increasing usage of high-speed circuitry, there is worry in our industry that in-circuit testing will be marginalized with no good substitute available. It is the purpose of this paper to show how access can be maintained, even on highly dense gigabit logic boards
ISSN:1089-3539
2378-2250
DOI:10.1109/TEST.2005.1584094