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Statistical characterization and Monte-Carlo simulation of low-frequency noise variations in foundry AMS/RF CMOS technology

Statistical characterization of low-frequency noise enables the prediction of 1/f noise with dispersions. The impact of downscaling on the low-frequency noise performance of foundry AMS/RF CMOS technology is thus evaluated. Meanwhile, a novel modeling approach uses Monte-Carlo simulation is develope...

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Bibliographic Details
Main Authors: Yang, M.T., Kuo, C.W., Chang, A.K.L., Wang, Y.J., Liu, S.
Format: Conference Proceeding
Language:English
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Summary:Statistical characterization of low-frequency noise enables the prediction of 1/f noise with dispersions. The impact of downscaling on the low-frequency noise performance of foundry AMS/RF CMOS technology is thus evaluated. Meanwhile, a novel modeling approach uses Monte-Carlo simulation is developed which includes statistical variations of individual device to capture the fluctuations in frequency and amplitude of the low-frequency noise of deep-sub-micrometer CMOS
DOI:10.1109/SMIC.2005.1587980