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A new body-effect elimination technique for ISFET measurement
This paper presents a new circuit technique to reduce the body-effect for more accurate ISFET measurement. In a floating source readout configuration, the most popular n-channel ISFET in a p-type silicon substrate is easily influenced by back gate bias. Based on a proposed bridge-type floating sourc...
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Main Authors: | , , , , |
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Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
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Summary: | This paper presents a new circuit technique to reduce the body-effect for more accurate ISFET measurement. In a floating source readout configuration, the most popular n-channel ISFET in a p-type silicon substrate is easily influenced by back gate bias. Based on a proposed bridge-type floating source circuitry, a current mirror and a MOS drawing the same drain current as the ISFET, the scheme allows reduction of influence of body effect. The proposed technique is simple and has a universal use for different kind of ISFETs |
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ISSN: | 1930-0395 2168-9229 |
DOI: | 10.1109/ICSENS.2005.1597882 |