Testing Analog and Mixed-Signal Circuits with Built-In Hardware - A New Approach

The subject paper aims to develop approach to testing analog and mixed-signal embedded cores-based system-on-chip (SOC) with built-in hardware. In particular, oscillation-based built-in self-test (OBIST) methodologies for testing analog parts in mixed-signal circuits are explored here. A major advan...

Full description

Saved in:
Bibliographic Details
Main Authors: Zakizadeh, J., Das, S.R., Assaf, M.H., Petriu, E.M., Sahinoglu, M., Jone, W.-B.
Format: Conference Proceeding
Language:English
Subjects:
Analog circuits
Automatic test equipment (ATE)
Automatic testing
Built-in self-test
built-in self-test (BIST)
Circuit testing
circuit under test (CUT)
Costs
design-for-testability (DFT)
Digital circuits
Hardware
mixed-signal test
oscillation-based built-in self-test (OBIST)
Semiconductor device testing
System testing
System-on-a-chip
system-on-chip (SOC)
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The subject paper aims to develop approach to testing analog and mixed-signal embedded cores-based system-on-chip (SOC) with built-in hardware. In particular, oscillation-based built-in self-test (OBIST) methodologies for testing analog parts in mixed-signal circuits are explored here. A major advantage of OBIST methods is that they do not require either stimulus generators or complex response analyzers, which makes them suitable for testing analog circuits in mixed-signal system-on-chip (SOC) environments. In this paper, analog circuit test techniques based on the principle of OBIST were implemented. Simulation results on some sample analog benchmark circuits are provided to demonstrate the feasibility of the proposed implementations
ISSN:1091-5281
DOI:10.1109/IMTC.2005.1604093