Further Generalization of the Low-Frequency True-RMS instrument

In this paper, it is shown that the use of random uniform dither in harmonics measurement can significantly shorten the word of applied A/D converter and shorten the word of applied base function (sine and/or cosine), stored in memory, without accuracy loosing. This fact enables design of simple ins...

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Bibliographic Details
Main Authors: Pjevalica, V., Vujicic, V.
Format: Conference Proceeding
Language:English
Subjects:
Artificial neural networks
dither
Frequency measurement
harmonic measurement
Instruments
Measurement errors
Measurement uncertainty
Polynomials
Power measurement
Semiconductor device measurement
stochastic
Stochastic processes
Time measurement
true RMS
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Summary:In this paper, it is shown that the use of random uniform dither in harmonics measurement can significantly shorten the word of applied A/D converter and shorten the word of applied base function (sine and/or cosine), stored in memory, without accuracy loosing. This fact enables design of simple instrument for harmonics measurement. It is proven theoretically, by simulation and by experiment that 6-bit dithered A/D converter word, 8-bit dithered base function word, and 6times8 (14-bits) multiplier word assure measurement of 16 harmonics (16 sine and 16 cosine components) with 13-bit accuracy. Putting n such simple devices in parallel it is possible to measure n times 16 harmonics simultaneously. The measurement of 1 times 16 harmonics is realized in the small PLD chip
ISSN:1091-5281
DOI:10.1109/IMTC.2005.1604291