Functional test of field programmable analog arrays

• Main Authors: Balen, T.R., Calvano, J.V., Lubaszewski, M.S., Renovelf, M.
• Format: Conference Proceeding
• Language: English
• Subjects: analog built-in self-test; Analog circuits; Built-in self-test; Circuit faults; Circuit testing; Field programmable analog arrays; FPAA; Functional programming; Libraries; Transfer functions; Transient analysis; Transient response; transient response analysis
• ISSN: 1093-0167; 2375-1053
• DOI: 10.1109/VTS.2006.37

In this work a strategy for testing analog networks, known as transient response analysis method, is applied to test the configurable analog blocks (CABs) of field programmable analog arrays (FPAAs). In this method the circuit under test (CUT) is programmed to implement first and second order blocks and the transient response of these blocks to known input stimuli is analyzed. Taking advantage of the inherent programmability of the FPAAs, a BIST-based scheme is used in order to obtain an error signal representing the difference between fault-free and faulty CABs. Different functions available in the component programming library are studied and a choice is made in order to obtain the best results in terms of sensitivity and test coverage. A functional fault model based on high-level parameters of the transfer function of the programmed blocks is adopted and the relationship between these parameters and CAB component deviations is investigated, therefore allowing to estimate the fault coverage and test application time of the proposed functional test method