"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC

In this paper, complex mixed signal circuits such as SiP or SOC including several ADCs and DACs are considered. A new DFT technique is proposed allowing the test of this complete set of embedded ADCs and DACs in a fully digital way such that only a simple low cost tester can be used. Moreover, this...

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Bibliographic Details
Main Authors: Kerzerho, V., Cauvet, P., Bernard, S., Azais, F., Comte, M., Renovell, M.
Format: Conference Proceeding
Language:English
Subjects:
Circuit testing
Costs
Crosstalk
Equations
Instruments
Intelligent networks
Semiconductor device measurement
Space exploration
System testing
System-on-a-chip
Online Access:Request full text
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Summary:In this paper, complex mixed signal circuits such as SiP or SOC including several ADCs and DACs are considered. A new DFT technique is proposed allowing the test of this complete set of embedded ADCs and DACs in a fully digital way such that only a simple low cost tester can be used. Moreover, this technique called "analogue network of converters" (ANC) requires an extremely simple additional circuitry and interconnect
ISSN:1530-1877
1558-1780
DOI:10.1109/ETS.2006.1