"Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC

In this paper, complex mixed signal circuits such as SiP or SOC including several ADCs and DACs are considered. A new DFT technique is proposed allowing the test of this complete set of embedded ADCs and DACs in a fully digital way such that only a simple low cost tester can be used. Moreover, this...

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Main Authors: Kerzerho, V., Cauvet, P., Bernard, S., Azais, F., Comte, M., Renovell, M.
Format: Conference Proceeding
Language:English
Subjects:
Circuit testing
Costs
Crosstalk
Equations
Instruments
Intelligent networks
Semiconductor device measurement
Space exploration
System testing
System-on-a-chip
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creator Kerzerho, V.
Cauvet, P.
Bernard, S.
Azais, F.
Comte, M.
Renovell, M.
description In this paper, complex mixed signal circuits such as SiP or SOC including several ADCs and DACs are considered. A new DFT technique is proposed allowing the test of this complete set of embedded ADCs and DACs in a fully digital way such that only a simple low cost tester can be used. Moreover, this technique called "analogue network of converters" (ANC) requires an extremely simple additional circuitry and interconnect
doi_str_mv 10.1109/ETS.2006.1
format conference_proceeding
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source IEEE Xplore All Conference Series
subjects Circuit testing
Costs
Crosstalk
Equations
Instruments
Intelligent networks
Semiconductor device measurement
Space exploration
System testing
System-on-a-chip
title "Analogue Network of Converters": A DFT Technique to Test a Complete Set of ADCs and DACs Embedded in a Complex SiP or SOC
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