Loading…
Design of the AGS Booster ionization profile monitor
The Alternating Gradient Synchrotron (AGS) booster ionization profile monitor (IPM) must operate in a vacuum of about 3*10/sup -/0/sup 11/ Torr. The authors present details of the design of the profile monitor. The ultra-high vacuum imposes certain requirements on detector gain and restrictions on c...
Saved in:
Main Authors: | , , , |
---|---|
Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | 1191 vol.2 |
container_issue | |
container_start_page | 1189 |
container_title | |
container_volume | |
creator | Stillman, A.N. Thern, R.E. Witkover, R.L. Van Zwienen, W.H. |
description | The Alternating Gradient Synchrotron (AGS) booster ionization profile monitor (IPM) must operate in a vacuum of about 3*10/sup -/0/sup 11/ Torr. The authors present details of the design of the profile monitor. The ultra-high vacuum imposes certain requirements on detector gain and restrictions on construction techniques. Each detector is a two-stage microchannel plate with an integral substrate containing sixty-four printed anodes. Formed electrodes provide uniform collection fields without the use of resistors, which would be unacceptable in these vacuum conditions. An ultraviolet light calibrates the detector in its permanent mounting. An extra set of electrodes performs a first order correction to the perturbations imposed by the horizontal and vertical collection electrodes.< > |
doi_str_mv | 10.1109/PAC.1991.164576 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_164576</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>164576</ieee_id><sourcerecordid>164576</sourcerecordid><originalsourceid>FETCH-LOGICAL-i1286-dcc6033fb6ce1bc2ebd82872ac935da592e64b23d926b26c09cab1a0f88cfabe3</originalsourceid><addsrcrecordid>eNotj8FKAzEURQNFsNauha7yAzPmJZNMshxHrUJBQV2XJPNSI21Tktno1zvQns2Bs7hwCbkDVgMwc__e9TUYAzWoRrZqRm5Yq5lgIKS-JstSftiElFpJMyfNI5a4O9IU6PiNtFt_0IeUyoiZxnSMf3acRE85hbhHepjSmPItuQp2X3B58YJ8PT999i_V5m392nebKgLXqhq8V0yI4JRHcJ6jGzTXLbfeCDlYaTiqxnExGK4cV54Zbx1YFrT2wToUC7I670ZE3J5yPNj8uz3_Ev8ugUMc</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Design of the AGS Booster ionization profile monitor</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Stillman, A.N. ; Thern, R.E. ; Witkover, R.L. ; Van Zwienen, W.H.</creator><creatorcontrib>Stillman, A.N. ; Thern, R.E. ; Witkover, R.L. ; Van Zwienen, W.H.</creatorcontrib><description>The Alternating Gradient Synchrotron (AGS) booster ionization profile monitor (IPM) must operate in a vacuum of about 3*10/sup -/0/sup 11/ Torr. The authors present details of the design of the profile monitor. The ultra-high vacuum imposes certain requirements on detector gain and restrictions on construction techniques. Each detector is a two-stage microchannel plate with an integral substrate containing sixty-four printed anodes. Formed electrodes provide uniform collection fields without the use of resistors, which would be unacceptable in these vacuum conditions. An ultraviolet light calibrates the detector in its permanent mounting. An extra set of electrodes performs a first order correction to the perturbations imposed by the horizontal and vertical collection electrodes.< ></description><identifier>ISBN: 0780301358</identifier><identifier>ISBN: 9780780301351</identifier><identifier>DOI: 10.1109/PAC.1991.164576</identifier><language>eng</language><publisher>IEEE</publisher><subject>Anodes ; Detectors ; Electrodes ; Electrons ; Ionization ; Microchannel ; Monitoring ; Structural beams ; Vacuum technology ; Wires</subject><ispartof>Conference Record of the 1991 IEEE Particle Accelerator Conference, 1991, p.1189-1191 vol.2</ispartof><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/164576$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/164576$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Stillman, A.N.</creatorcontrib><creatorcontrib>Thern, R.E.</creatorcontrib><creatorcontrib>Witkover, R.L.</creatorcontrib><creatorcontrib>Van Zwienen, W.H.</creatorcontrib><title>Design of the AGS Booster ionization profile monitor</title><title>Conference Record of the 1991 IEEE Particle Accelerator Conference</title><addtitle>PAC</addtitle><description>The Alternating Gradient Synchrotron (AGS) booster ionization profile monitor (IPM) must operate in a vacuum of about 3*10/sup -/0/sup 11/ Torr. The authors present details of the design of the profile monitor. The ultra-high vacuum imposes certain requirements on detector gain and restrictions on construction techniques. Each detector is a two-stage microchannel plate with an integral substrate containing sixty-four printed anodes. Formed electrodes provide uniform collection fields without the use of resistors, which would be unacceptable in these vacuum conditions. An ultraviolet light calibrates the detector in its permanent mounting. An extra set of electrodes performs a first order correction to the perturbations imposed by the horizontal and vertical collection electrodes.< ></description><subject>Anodes</subject><subject>Detectors</subject><subject>Electrodes</subject><subject>Electrons</subject><subject>Ionization</subject><subject>Microchannel</subject><subject>Monitoring</subject><subject>Structural beams</subject><subject>Vacuum technology</subject><subject>Wires</subject><isbn>0780301358</isbn><isbn>9780780301351</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1991</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotj8FKAzEURQNFsNauha7yAzPmJZNMshxHrUJBQV2XJPNSI21Tktno1zvQns2Bs7hwCbkDVgMwc__e9TUYAzWoRrZqRm5Yq5lgIKS-JstSftiElFpJMyfNI5a4O9IU6PiNtFt_0IeUyoiZxnSMf3acRE85hbhHepjSmPItuQp2X3B58YJ8PT999i_V5m392nebKgLXqhq8V0yI4JRHcJ6jGzTXLbfeCDlYaTiqxnExGK4cV54Zbx1YFrT2wToUC7I670ZE3J5yPNj8uz3_Ev8ugUMc</recordid><startdate>1991</startdate><enddate>1991</enddate><creator>Stillman, A.N.</creator><creator>Thern, R.E.</creator><creator>Witkover, R.L.</creator><creator>Van Zwienen, W.H.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1991</creationdate><title>Design of the AGS Booster ionization profile monitor</title><author>Stillman, A.N. ; Thern, R.E. ; Witkover, R.L. ; Van Zwienen, W.H.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i1286-dcc6033fb6ce1bc2ebd82872ac935da592e64b23d926b26c09cab1a0f88cfabe3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1991</creationdate><topic>Anodes</topic><topic>Detectors</topic><topic>Electrodes</topic><topic>Electrons</topic><topic>Ionization</topic><topic>Microchannel</topic><topic>Monitoring</topic><topic>Structural beams</topic><topic>Vacuum technology</topic><topic>Wires</topic><toplevel>online_resources</toplevel><creatorcontrib>Stillman, A.N.</creatorcontrib><creatorcontrib>Thern, R.E.</creatorcontrib><creatorcontrib>Witkover, R.L.</creatorcontrib><creatorcontrib>Van Zwienen, W.H.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Stillman, A.N.</au><au>Thern, R.E.</au><au>Witkover, R.L.</au><au>Van Zwienen, W.H.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Design of the AGS Booster ionization profile monitor</atitle><btitle>Conference Record of the 1991 IEEE Particle Accelerator Conference</btitle><stitle>PAC</stitle><date>1991</date><risdate>1991</risdate><spage>1189</spage><epage>1191 vol.2</epage><pages>1189-1191 vol.2</pages><isbn>0780301358</isbn><isbn>9780780301351</isbn><abstract>The Alternating Gradient Synchrotron (AGS) booster ionization profile monitor (IPM) must operate in a vacuum of about 3*10/sup -/0/sup 11/ Torr. The authors present details of the design of the profile monitor. The ultra-high vacuum imposes certain requirements on detector gain and restrictions on construction techniques. Each detector is a two-stage microchannel plate with an integral substrate containing sixty-four printed anodes. Formed electrodes provide uniform collection fields without the use of resistors, which would be unacceptable in these vacuum conditions. An ultraviolet light calibrates the detector in its permanent mounting. An extra set of electrodes performs a first order correction to the perturbations imposed by the horizontal and vertical collection electrodes.< ></abstract><pub>IEEE</pub><doi>10.1109/PAC.1991.164576</doi><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISBN: 0780301358 |
ispartof | Conference Record of the 1991 IEEE Particle Accelerator Conference, 1991, p.1189-1191 vol.2 |
issn | |
language | eng |
recordid | cdi_ieee_primary_164576 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Anodes Detectors Electrodes Electrons Ionization Microchannel Monitoring Structural beams Vacuum technology Wires |
title | Design of the AGS Booster ionization profile monitor |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-24T18%3A25%3A11IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Design%20of%20the%20AGS%20Booster%20ionization%20profile%20monitor&rft.btitle=Conference%20Record%20of%20the%201991%20IEEE%20Particle%20Accelerator%20Conference&rft.au=Stillman,%20A.N.&rft.date=1991&rft.spage=1189&rft.epage=1191%20vol.2&rft.pages=1189-1191%20vol.2&rft.isbn=0780301358&rft.isbn_list=9780780301351&rft_id=info:doi/10.1109/PAC.1991.164576&rft_dat=%3Cieee_6IE%3E164576%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i1286-dcc6033fb6ce1bc2ebd82872ac935da592e64b23d926b26c09cab1a0f88cfabe3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=164576&rfr_iscdi=true |