An improved detector scheme for nondestructive reverse bias safe operating area test systems

An enhanced second-breakdown detector for a nondestructive reverse bias safe operating area test system has been developed. The detector corrects the previously reported deficiencies in the original detector. In addition, the enhancements to the detector can detect a new second-breakdown waveform th...

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Bibliographic Details
Published in:IEEE transactions on instrumentation and measurement 1992-10, Vol.41 (5), p.657-662
Main Author: Turner, A.E.
Format: Article
Language:English
Subjects:
Applied sciences
Breakdown voltage
Circuit testing
Delay effects
Detectors
Electric breakdown
Electronics
Exact sciences and technology
Fabrication
Low voltage
Miscellaneous
Nondestructive testing
Power system protection
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
System testing
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Description
Summary:An enhanced second-breakdown detector for a nondestructive reverse bias safe operating area test system has been developed. The detector corrects the previously reported deficiencies in the original detector. In addition, the enhancements to the detector can detect a new second-breakdown waveform that had not previously been identified.< >
ISSN:0018-9456
1557-9662
DOI:10.1109/19.177338