Six-port and four-port reflectometers for complex permittivity measurements at submillimeter wavelengths

The frequency range of six-port reflectometry is extended into the submillimeter wavelength range. The complex permittivity of low-loss microwave materials is determined using novel six-port and four-port reflectometers. These either consist of quasi-optical components or utilize oversized waveguide...

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Bibliographic Details
Published in:IEEE transactions on microwave theory and techniques 1989-01, Vol.37 (1), p.222-230
Main Author: Stumper, U.
Format: Article
Language:English
Subjects:
Applied sciences
Dielectric loss measurement
Dielectric losses
Dielectric measurements
Electronics
Exact sciences and technology
Frequency
Permittivity measurement
Reflection
Reflectometry
Submillimeter wave measurements
Submillimeter wave technology
Testing, measurement, noise and reliability
Wavelength measurement
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Summary:The frequency range of six-port reflectometry is extended into the submillimeter wavelength range. The complex permittivity of low-loss microwave materials is determined using novel six-port and four-port reflectometers. These either consist of quasi-optical components or utilize oversized waveguide techniques. Permittivity measurements of materials possessing a wide range of values of epsilon ' (2 to 7) and of the loss tangent (0.0003 to 0.03) were carried out at frequencies of about 380 GHz to 390 GHz. Good agreement with published permittivity data is shown. Moreover, the equivalance of the simple waveguide four-port reflectometer (which is preferred because of its easy handling and high stability against temperature fluctuations) to the quasi-optical reflectometers is shown.< >
ISSN:0018-9480
1557-9670
DOI:10.1109/22.20042