VLSI reliability in Europe

Several issue's regarding VLSI reliability research in Europe are discussed. Organizations involved in stimulating the activities on reliability by exchanging information or supporting research programs are described. Within one such program, ESPRIT, a technical interest group on IC reliability...

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Bibliographic Details
Published in:Proceedings of the IEEE 1993-05, Vol.81 (5), p.675-681
Main Author: Verweij, J.F.
Format: Article
Language:English
Subjects:
Circuit simulation
Educational programs
Electric breakdown
Europe
Plastic packaging
Production
Reliability engineering
Standardization
Temperature
Very large scale integration
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Summary:Several issue's regarding VLSI reliability research in Europe are discussed. Organizations involved in stimulating the activities on reliability by exchanging information or supporting research programs are described. Within one such program, ESPRIT, a technical interest group on IC reliability was formed to formulate particular needs and necessary improvements in education and research. In addition to ESPRIT research projects, there are smaller projects on reliability subjects. Two examples, one dealing with plastic-encapsulation and the other with electrostatic discharge, are treated in some detail. Some achievements in the areas of oxide breakdown and plastic encapsulated ICs in temperature cycling are also presented. A few opinions are offered on trends in reliability engineering, including reliability circuit simulation.< >
ISSN:0018-9219
1558-2256
DOI:10.1109/5.220899