Quantitative analysis of integrated optic waveguide spectrometers

We show how scalar diffraction theory can be used to quantitatively evaluate insertion losses in integrated optic spectrometers based on planar waveguide and etched grating technologies. This approach is applied to optimize the loss-limited spectral operating range of these devices. We also show how...

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Bibliographic Details
Published in:IEEE photonics technology letters 1994-02, Vol.6 (2), p.242-244
Main Authors: Deri, R.J., Kallman, J.S., Dijaili, S.P.
Format: Article
Language:English
Subjects:
440600 - Optical Instrumentation- (1990-)
Applied sciences
Circuit properties
DESIGN
DIFFRACTION GRATINGS
Electric, optical and optoelectronic circuits
ELECTROMAGNETIC RADIATION
Electronics
Etching
Exact sciences and technology
GRATINGS
Insertion loss
Integrated optics
Integrated optics. Optical fibers and wave guides
MEASURING INSTRUMENTS
OPERATION
Optical and optoelectronic circuits
Optical diffraction
Optical losses
Optical planar waveguides
Optical waveguide theory
Optical waveguides
OTHER INSTRUMENTATION
Planar waveguides
RADIATIONS
SPECTROMETERS
Spectroscopy
USES
VISIBLE RADIATION
WAVEGUIDES
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Summary:We show how scalar diffraction theory can be used to quantitatively evaluate insertion losses in integrated optic spectrometers based on planar waveguide and etched grating technologies. This approach is applied to optimize the loss-limited spectral operating range of these devices. We also show how limitations in the photolithographic process used for grating definition can result in appreciable spectrometer insertion losses.< >
ISSN:1041-1135
1941-0174
DOI:10.1109/68.275438