A study of the stability of some Zener-diode based voltage standards

We report on a study of factors limiting the precision of Zener-diode based electronic voltage standards of the type the most widely used at the highest levels of accuracy in national metrology institutes. Frequency-dependent noise is the major factor limiting short-term stability to about one part...

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Main Authors: Witt, T.J., Reymann, D., Avrons, D.
Format: Conference Proceeding
Language:English
Subjects:
Circuit noise
Frequency
Humidity
Laboratories
Metrology
Optical noise
Resistors
Stability
Temperature
Voltage
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Reymann, D.
Avrons, D.
description We report on a study of factors limiting the precision of Zener-diode based electronic voltage standards of the type the most widely used at the highest levels of accuracy in national metrology institutes. Frequency-dependent noise is the major factor limiting short-term stability to about one part in 10/sup 8/. Medium- and long-term stability is severely limited by humidity effects; variations of relative humidity of 0.01 can cause changes of 0.1 /spl mu/V or more in the 1.018 V output.< >
doi_str_mv 10.1109/CPEM.1994.333451
format conference_proceeding
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Frequency-dependent noise is the major factor limiting short-term stability to about one part in 10/sup 8/. Medium- and long-term stability is severely limited by humidity effects; variations of relative humidity of 0.01 can cause changes of 0.1 /spl mu/V or more in the 1.018 V output.&lt; &gt;</abstract><pub>IEEE</pub><doi>10.1109/CPEM.1994.333451</doi></addata></record>
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ispartof Proceedings of Conference on Precision Electromagnetic Measurements Digest, 1994, p.274-275
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subjects Circuit noise
Frequency
Humidity
Laboratories
Metrology
Optical noise
Resistors
Stability
Temperature
Voltage
title A study of the stability of some Zener-diode based voltage standards
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