Minimum test sets for locally exhaustive testing of combinational circuits with five outputs

In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2/sup w/ test patterns, where w is the maximum number of inputs on which any output depends.<...

Full description

Saved in:
Bibliographic Details
Published in:Proceedings of IEEE 3rd Asian Test Symposium (ATS) 1994-11, p.280-285
Main Authors: Yokohira, T., Shimizu, T., Michinishi, H., Sugiyama, Y., Okamoto, T.
Format: Article
Language:English
Subjects:
Automatic testing
Circuit faults
Circuit testing
Combinational circuits
Terminology
Vectors
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:In this paper, features of dependence matrices of combinational circuits with five outputs are discussed, and it is shown that a minimum test set for locally exhaustive testing of such circuits always has 2/sup w/ test patterns, where w is the maximum number of inputs on which any output depends.< >
DOI:10.1109/ATS.1994.367218