Loading…

Studies on the high temperature superconductor (HTS)/metal/polymer dielectric interconnect structure for packaging applications

A HTS/metal/low dielectric constant polymer dielectric hybrid interconnect structure was fabricated using high density interconnect (HDI) copper/polyimide processing techniques. Nondegraded superconducting properties, J/sub c/ of over 1 MAcm/sup -2/ and T/sub c/ of 88 K, were obtained using optimum...

Full description

Saved in:
Bibliographic Details
Main Authors: Paik, K.W., Mogro-Campero, A.
Format: Conference Proceeding
Language:English
Subjects:
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
cited_by
cites
container_end_page 366
container_issue
container_start_page 362
container_title
container_volume
creator Paik, K.W.
Mogro-Campero, A.
description A HTS/metal/low dielectric constant polymer dielectric hybrid interconnect structure was fabricated using high density interconnect (HDI) copper/polyimide processing techniques. Nondegraded superconducting properties, J/sub c/ of over 1 MAcm/sup -2/ and T/sub c/ of 88 K, were obtained using optimum processing conditions. A 0.6 /spl mu/m-thick YBCO film was coevaporated on LaAlO/sub 3/ substrate, annealed, patterned, and Au contact pads were deposited. A siloxane polyimide (SPI) base adhesive at 170-210/spl deg/C or a polyester base adhesive at 150/spl deg/C was laminated on HTS parts in an oxygen environment. Vias were drilled on the polymer layer using a 351 nm Ar laser followed by subsequent via cleaning with O/sub 2/+CF/sub 4/ plasma. To complete test parts Ti/Cu/Ti metallization and patterning with a laser adaptive lithography were followed. It was found that the laminated polymer film on the HTS protected HTS film properties from heating and water. The laminated HTS film maintains its superconductivity up to 210/spl deg/C of lamination temperature. The hybrid structure also showed excellent reliability performances: 6% J/sub c/ decrease at 150/spl deg/C/65 h thermal bake, 12% J/sub c/ decrease after 100 thermal cycles from -196 to 150/spl deg/C, and maintain superconductivity in water immersion up to more than 10 h. T/sub c/ of samples remained always the same 88 K. Coplanar HTS lines, microstrip HTS/metal lines, and HTS power strip line structures were demonstrated on a 2-in. diameter HTS wafer coupon.< >
doi_str_mv 10.1109/ECTC.1994.367563
format conference_proceeding
fullrecord <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_367563</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>367563</ieee_id><sourcerecordid>367563</sourcerecordid><originalsourceid>FETCH-LOGICAL-i172t-70ecae0483f0aa07db8f1d0a31c0482b9a214e129e57257acd25a021cac1f9243</originalsourceid><addsrcrecordid>eNotkL1PwzAQxS0hJFDpjpg8wtDWX6njEUWFIlViaJmrq3NJDPmS7Qyd-NcxlNOT7u7pfm84Qu45W3LOzGpTHIolN0Yt5Vpna3lF5kbnLEkyw5W4IfMQPlkqlXGRq1vyvY9T6TDQoaexQdq4uqERuxE9xMkjDVMa7dCXk42Dp4_bw_5p1WGEdjUO7blDTxPfoo3eWer6-Hfdp52G6BP0G1IlcgT7BbXrawrj2DoL0Q19uCPXFbQB5_99Rj5eNodiu9i9v74Vz7uF41rEhWZoAZnKZcUAmC5PecVLBpLbZIqTAcEVcmEw0yLTYEuRARPcguWVEUrOyMMl1yHicfSuA38-Xr4kfwDboGCa</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Studies on the high temperature superconductor (HTS)/metal/polymer dielectric interconnect structure for packaging applications</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Paik, K.W. ; Mogro-Campero, A.</creator><creatorcontrib>Paik, K.W. ; Mogro-Campero, A.</creatorcontrib><description>A HTS/metal/low dielectric constant polymer dielectric hybrid interconnect structure was fabricated using high density interconnect (HDI) copper/polyimide processing techniques. Nondegraded superconducting properties, J/sub c/ of over 1 MAcm/sup -2/ and T/sub c/ of 88 K, were obtained using optimum processing conditions. A 0.6 /spl mu/m-thick YBCO film was coevaporated on LaAlO/sub 3/ substrate, annealed, patterned, and Au contact pads were deposited. A siloxane polyimide (SPI) base adhesive at 170-210/spl deg/C or a polyester base adhesive at 150/spl deg/C was laminated on HTS parts in an oxygen environment. Vias were drilled on the polymer layer using a 351 nm Ar laser followed by subsequent via cleaning with O/sub 2/+CF/sub 4/ plasma. To complete test parts Ti/Cu/Ti metallization and patterning with a laser adaptive lithography were followed. It was found that the laminated polymer film on the HTS protected HTS film properties from heating and water. The laminated HTS film maintains its superconductivity up to 210/spl deg/C of lamination temperature. The hybrid structure also showed excellent reliability performances: 6% J/sub c/ decrease at 150/spl deg/C/65 h thermal bake, 12% J/sub c/ decrease after 100 thermal cycles from -196 to 150/spl deg/C, and maintain superconductivity in water immersion up to more than 10 h. T/sub c/ of samples remained always the same 88 K. Coplanar HTS lines, microstrip HTS/metal lines, and HTS power strip line structures were demonstrated on a 2-in. diameter HTS wafer coupon.&lt; &gt;</description><identifier>ISBN: 9780780309142</identifier><identifier>ISBN: 0780309146</identifier><identifier>DOI: 10.1109/ECTC.1994.367563</identifier><language>eng</language><publisher>IEEE</publisher><subject>Dielectric constant ; High temperature superconductors ; Maintenance ; Polyimides ; Polymer films ; Substrates ; Superconducting films ; Superconductivity ; Water heating ; Yttrium barium copper oxide</subject><ispartof>1994 Proceedings. 44th Electronic Components and Technology Conference, 1994, p.362-366</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/367563$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,4050,4051,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/367563$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Paik, K.W.</creatorcontrib><creatorcontrib>Mogro-Campero, A.</creatorcontrib><title>Studies on the high temperature superconductor (HTS)/metal/polymer dielectric interconnect structure for packaging applications</title><title>1994 Proceedings. 44th Electronic Components and Technology Conference</title><addtitle>ECTC</addtitle><description>A HTS/metal/low dielectric constant polymer dielectric hybrid interconnect structure was fabricated using high density interconnect (HDI) copper/polyimide processing techniques. Nondegraded superconducting properties, J/sub c/ of over 1 MAcm/sup -2/ and T/sub c/ of 88 K, were obtained using optimum processing conditions. A 0.6 /spl mu/m-thick YBCO film was coevaporated on LaAlO/sub 3/ substrate, annealed, patterned, and Au contact pads were deposited. A siloxane polyimide (SPI) base adhesive at 170-210/spl deg/C or a polyester base adhesive at 150/spl deg/C was laminated on HTS parts in an oxygen environment. Vias were drilled on the polymer layer using a 351 nm Ar laser followed by subsequent via cleaning with O/sub 2/+CF/sub 4/ plasma. To complete test parts Ti/Cu/Ti metallization and patterning with a laser adaptive lithography were followed. It was found that the laminated polymer film on the HTS protected HTS film properties from heating and water. The laminated HTS film maintains its superconductivity up to 210/spl deg/C of lamination temperature. The hybrid structure also showed excellent reliability performances: 6% J/sub c/ decrease at 150/spl deg/C/65 h thermal bake, 12% J/sub c/ decrease after 100 thermal cycles from -196 to 150/spl deg/C, and maintain superconductivity in water immersion up to more than 10 h. T/sub c/ of samples remained always the same 88 K. Coplanar HTS lines, microstrip HTS/metal lines, and HTS power strip line structures were demonstrated on a 2-in. diameter HTS wafer coupon.&lt; &gt;</description><subject>Dielectric constant</subject><subject>High temperature superconductors</subject><subject>Maintenance</subject><subject>Polyimides</subject><subject>Polymer films</subject><subject>Substrates</subject><subject>Superconducting films</subject><subject>Superconductivity</subject><subject>Water heating</subject><subject>Yttrium barium copper oxide</subject><isbn>9780780309142</isbn><isbn>0780309146</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>1994</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotkL1PwzAQxS0hJFDpjpg8wtDWX6njEUWFIlViaJmrq3NJDPmS7Qyd-NcxlNOT7u7pfm84Qu45W3LOzGpTHIolN0Yt5Vpna3lF5kbnLEkyw5W4IfMQPlkqlXGRq1vyvY9T6TDQoaexQdq4uqERuxE9xMkjDVMa7dCXk42Dp4_bw_5p1WGEdjUO7blDTxPfoo3eWer6-Hfdp52G6BP0G1IlcgT7BbXrawrj2DoL0Q19uCPXFbQB5_99Rj5eNodiu9i9v74Vz7uF41rEhWZoAZnKZcUAmC5PecVLBpLbZIqTAcEVcmEw0yLTYEuRARPcguWVEUrOyMMl1yHicfSuA38-Xr4kfwDboGCa</recordid><startdate>1994</startdate><enddate>1994</enddate><creator>Paik, K.W.</creator><creator>Mogro-Campero, A.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1994</creationdate><title>Studies on the high temperature superconductor (HTS)/metal/polymer dielectric interconnect structure for packaging applications</title><author>Paik, K.W. ; Mogro-Campero, A.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i172t-70ecae0483f0aa07db8f1d0a31c0482b9a214e129e57257acd25a021cac1f9243</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1994</creationdate><topic>Dielectric constant</topic><topic>High temperature superconductors</topic><topic>Maintenance</topic><topic>Polyimides</topic><topic>Polymer films</topic><topic>Substrates</topic><topic>Superconducting films</topic><topic>Superconductivity</topic><topic>Water heating</topic><topic>Yttrium barium copper oxide</topic><toplevel>online_resources</toplevel><creatorcontrib>Paik, K.W.</creatorcontrib><creatorcontrib>Mogro-Campero, A.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Xplore</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Paik, K.W.</au><au>Mogro-Campero, A.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Studies on the high temperature superconductor (HTS)/metal/polymer dielectric interconnect structure for packaging applications</atitle><btitle>1994 Proceedings. 44th Electronic Components and Technology Conference</btitle><stitle>ECTC</stitle><date>1994</date><risdate>1994</risdate><spage>362</spage><epage>366</epage><pages>362-366</pages><isbn>9780780309142</isbn><isbn>0780309146</isbn><abstract>A HTS/metal/low dielectric constant polymer dielectric hybrid interconnect structure was fabricated using high density interconnect (HDI) copper/polyimide processing techniques. Nondegraded superconducting properties, J/sub c/ of over 1 MAcm/sup -2/ and T/sub c/ of 88 K, were obtained using optimum processing conditions. A 0.6 /spl mu/m-thick YBCO film was coevaporated on LaAlO/sub 3/ substrate, annealed, patterned, and Au contact pads were deposited. A siloxane polyimide (SPI) base adhesive at 170-210/spl deg/C or a polyester base adhesive at 150/spl deg/C was laminated on HTS parts in an oxygen environment. Vias were drilled on the polymer layer using a 351 nm Ar laser followed by subsequent via cleaning with O/sub 2/+CF/sub 4/ plasma. To complete test parts Ti/Cu/Ti metallization and patterning with a laser adaptive lithography were followed. It was found that the laminated polymer film on the HTS protected HTS film properties from heating and water. The laminated HTS film maintains its superconductivity up to 210/spl deg/C of lamination temperature. The hybrid structure also showed excellent reliability performances: 6% J/sub c/ decrease at 150/spl deg/C/65 h thermal bake, 12% J/sub c/ decrease after 100 thermal cycles from -196 to 150/spl deg/C, and maintain superconductivity in water immersion up to more than 10 h. T/sub c/ of samples remained always the same 88 K. Coplanar HTS lines, microstrip HTS/metal lines, and HTS power strip line structures were demonstrated on a 2-in. diameter HTS wafer coupon.&lt; &gt;</abstract><pub>IEEE</pub><doi>10.1109/ECTC.1994.367563</doi><tpages>5</tpages></addata></record>
fulltext fulltext_linktorsrc
identifier ISBN: 9780780309142
ispartof 1994 Proceedings. 44th Electronic Components and Technology Conference, 1994, p.362-366
issn
language eng
recordid cdi_ieee_primary_367563
source IEEE Electronic Library (IEL) Conference Proceedings
subjects Dielectric constant
High temperature superconductors
Maintenance
Polyimides
Polymer films
Substrates
Superconducting films
Superconductivity
Water heating
Yttrium barium copper oxide
title Studies on the high temperature superconductor (HTS)/metal/polymer dielectric interconnect structure for packaging applications
url http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-26T17%3A35%3A52IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Studies%20on%20the%20high%20temperature%20superconductor%20(HTS)/metal/polymer%20dielectric%20interconnect%20structure%20for%20packaging%20applications&rft.btitle=1994%20Proceedings.%2044th%20Electronic%20Components%20and%20Technology%20Conference&rft.au=Paik,%20K.W.&rft.date=1994&rft.spage=362&rft.epage=366&rft.pages=362-366&rft.isbn=9780780309142&rft.isbn_list=0780309146&rft_id=info:doi/10.1109/ECTC.1994.367563&rft_dat=%3Cieee_6IE%3E367563%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i172t-70ecae0483f0aa07db8f1d0a31c0482b9a214e129e57257acd25a021cac1f9243%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=367563&rfr_iscdi=true