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VERTEX: VERification of Transistor-level circuits based on model EXtraction
VERTEX, a program that performs formal verification of synchronous sequential circuits that are characterized at the transistor-level is described. Additionally, VERTEX can compare gate-level designs or Boolean specifications against their switch-level implementations. VERTEX verifies a hardware des...
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creator | Moondanos, J. Wehbeh, J.A. Abrahamn, J.A. Saab, D.G. |
description | VERTEX, a program that performs formal verification of synchronous sequential circuits that are characterized at the transistor-level is described. Additionally, VERTEX can compare gate-level designs or Boolean specifications against their switch-level implementations. VERTEX verifies a hardware design by employing novel techniques to extract the relevant state variables of a switch-level circuit and to compare the finite state machine descriptions of hardware designs based on formal methods for the verification of sequential circuits.< > |
doi_str_mv | 10.1109/EDAC.1993.386491 |
format | conference_proceeding |
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Press</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>1993</creationdate><title>VERTEX: VERification of Transistor-level circuits based on model EXtraction</title><author>Moondanos, J. ; Wehbeh, J.A. ; Abrahamn, J.A. ; Saab, D.G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-ieee_primary_3864913</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>1993</creationdate><topic>Automata</topic><topic>Contracts</topic><topic>Formal verification</topic><topic>Hardware</topic><topic>High performance computing</topic><topic>Manufacturing processes</topic><topic>Reliability engineering</topic><topic>Sequential circuits</topic><topic>Switching circuits</topic><topic>Very large scale integration</topic><toplevel>online_resources</toplevel><creatorcontrib>Moondanos, J.</creatorcontrib><creatorcontrib>Wehbeh, J.A.</creatorcontrib><creatorcontrib>Abrahamn, J.A.</creatorcontrib><creatorcontrib>Saab, D.G.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library Online</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Moondanos, J.</au><au>Wehbeh, J.A.</au><au>Abrahamn, J.A.</au><au>Saab, D.G.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>VERTEX: VERification of Transistor-level circuits based on model EXtraction</atitle><btitle>1993 European Conference on Design Automation with the European Event in ASIC Design</btitle><stitle>EDAC</stitle><date>1993</date><risdate>1993</risdate><spage>111</spage><epage>115</epage><pages>111-115</pages><isbn>9780818634109</isbn><isbn>0818634103</isbn><abstract>VERTEX, a program that performs formal verification of synchronous sequential circuits that are characterized at the transistor-level is described. 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ispartof | 1993 European Conference on Design Automation with the European Event in ASIC Design, 1993, p.111-115 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Automata Contracts Formal verification Hardware High performance computing Manufacturing processes Reliability engineering Sequential circuits Switching circuits Very large scale integration |
title | VERTEX: VERification of Transistor-level circuits based on model EXtraction |
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