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ESD Immunity Test and Several Improvements for Digital Electronic Dictionary
Electronic devices are getting more and more sensitive to the electro-static discharge (ESD) because of their smaller size and higher frequency. An electronic dictionary device studied here has failed in the ESD immunity test according to the IEC61000-4-2 standard. Many factors which could impact on...
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creator | Wang Xiqin Huang Jiusheng Gao Yougang Liu Suling Zhou Feng Wang Langfeng |
description | Electronic devices are getting more and more sensitive to the electro-static discharge (ESD) because of their smaller size and higher frequency. An electronic dictionary device studied here has failed in the ESD immunity test according to the IEC61000-4-2 standard. Many factors which could impact on the ESD immunity performance of the device are investigated in the test and some suggestions are also given in this paper for improving its performance. The improving suggestions are listed and analyzed combining the device in detail in this paper: 1) improving the ESD immunity performance of the dictionary's PCB; 2) changing the outer package material for the dictionary, protecting the LED; and 3) building a complete ESD test system. The device has gained a significant improvement on the ESD immunity by using merely part of our suggestions. We hope that this could be a reference to the manufactures of similar devices as well |
doi_str_mv | 10.1109/CEEM.2006.257909 |
format | conference_proceeding |
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An electronic dictionary device studied here has failed in the ESD immunity test according to the IEC61000-4-2 standard. Many factors which could impact on the ESD immunity performance of the device are investigated in the test and some suggestions are also given in this paper for improving its performance. The improving suggestions are listed and analyzed combining the device in detail in this paper: 1) improving the ESD immunity performance of the dictionary's PCB; 2) changing the outer package material for the dictionary, protecting the LED; and 3) building a complete ESD test system. The device has gained a significant improvement on the ESD immunity by using merely part of our suggestions. We hope that this could be a reference to the manufactures of similar devices as well</description><identifier>ISBN: 1424401836</identifier><identifier>ISBN: 9781424401833</identifier><identifier>DOI: 10.1109/CEEM.2006.257909</identifier><language>eng</language><publisher>IEEE</publisher><subject>Dictionaries ; electronic dictionary ; Electronic equipment testing ; Electrostatic discharge ; ESD ; Frequency ; Immunity testing ; Light emitting diodes ; Materials testing ; package material ; Packaging ; PCB ; Performance analysis ; Protection</subject><ispartof>The 2006 4th Asia-Pacific Conference on Environmental Electromagnetics, 2006, p.71-75</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4027241$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4027241$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Wang Xiqin</creatorcontrib><creatorcontrib>Huang Jiusheng</creatorcontrib><creatorcontrib>Gao Yougang</creatorcontrib><creatorcontrib>Liu Suling</creatorcontrib><creatorcontrib>Zhou Feng</creatorcontrib><creatorcontrib>Wang Langfeng</creatorcontrib><title>ESD Immunity Test and Several Improvements for Digital Electronic Dictionary</title><title>The 2006 4th Asia-Pacific Conference on Environmental Electromagnetics</title><addtitle>CEEM</addtitle><description>Electronic devices are getting more and more sensitive to the electro-static discharge (ESD) because of their smaller size and higher frequency. An electronic dictionary device studied here has failed in the ESD immunity test according to the IEC61000-4-2 standard. Many factors which could impact on the ESD immunity performance of the device are investigated in the test and some suggestions are also given in this paper for improving its performance. The improving suggestions are listed and analyzed combining the device in detail in this paper: 1) improving the ESD immunity performance of the dictionary's PCB; 2) changing the outer package material for the dictionary, protecting the LED; and 3) building a complete ESD test system. The device has gained a significant improvement on the ESD immunity by using merely part of our suggestions. 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An electronic dictionary device studied here has failed in the ESD immunity test according to the IEC61000-4-2 standard. Many factors which could impact on the ESD immunity performance of the device are investigated in the test and some suggestions are also given in this paper for improving its performance. The improving suggestions are listed and analyzed combining the device in detail in this paper: 1) improving the ESD immunity performance of the dictionary's PCB; 2) changing the outer package material for the dictionary, protecting the LED; and 3) building a complete ESD test system. The device has gained a significant improvement on the ESD immunity by using merely part of our suggestions. We hope that this could be a reference to the manufactures of similar devices as well</abstract><pub>IEEE</pub><doi>10.1109/CEEM.2006.257909</doi><tpages>5</tpages></addata></record> |
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identifier | ISBN: 1424401836 |
ispartof | The 2006 4th Asia-Pacific Conference on Environmental Electromagnetics, 2006, p.71-75 |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Dictionaries electronic dictionary Electronic equipment testing Electrostatic discharge ESD Frequency Immunity testing Light emitting diodes Materials testing package material Packaging PCB Performance analysis Protection |
title | ESD Immunity Test and Several Improvements for Digital Electronic Dictionary |
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