Inherited Redundancy and Configurability Utilization for Repairing Nanowire Crossbars with Clustered Defects

With the recent development of nanoscale materials and assembly techniques, it is envisioned to build high-density reconfigurable systems which have never been achieved by the photolithography. Various reconfigurable architectures have been proposed based on nanowire crossbar structure as the primit...

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Bibliographic Details
Main Authors: Yellambalase, Y., Minsu Choi, Yong-Bin Kim
Format: Conference Proceeding
Language:English
Subjects:
Assembly systems
Circuit testing
Clustering algorithms
Computer architecture
Lithography
Logic devices
Nanoscale devices
Nanostructures
Reconfigurable logic
Wires
Online Access:Request full text
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Summary:With the recent development of nanoscale materials and assembly techniques, it is envisioned to build high-density reconfigurable systems which have never been achieved by the photolithography. Various reconfigurable architectures have been proposed based on nanowire crossbar structure as the primitive building block. Unfortunately, high-density systems consisting of nanometer-scale elements are likely to have many imperfections and variations; thus, defect-tolerance is considered as one of the most exigent challenges. In this paper, we evaluate three different logic mapping algorithms with defect avoidance to circumvent clustered defective crosspoints in nanowire reconfigurable crossbar architectures. The effectiveness of inherited redundancy and configurability utilization is demonstrated through extensive parametric simulations
ISSN:1550-5774
2377-7966
DOI:10.1109/DFT.2006.37