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Inherited Redundancy and Configurability Utilization for Repairing Nanowire Crossbars with Clustered Defects
With the recent development of nanoscale materials and assembly techniques, it is envisioned to build high-density reconfigurable systems which have never been achieved by the photolithography. Various reconfigurable architectures have been proposed based on nanowire crossbar structure as the primit...
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| creator | Yellambalase, Y. Minsu Choi Yong-Bin Kim |
| description | With the recent development of nanoscale materials and assembly techniques, it is envisioned to build high-density reconfigurable systems which have never been achieved by the photolithography. Various reconfigurable architectures have been proposed based on nanowire crossbar structure as the primitive building block. Unfortunately, high-density systems consisting of nanometer-scale elements are likely to have many imperfections and variations; thus, defect-tolerance is considered as one of the most exigent challenges. In this paper, we evaluate three different logic mapping algorithms with defect avoidance to circumvent clustered defective crosspoints in nanowire reconfigurable crossbar architectures. The effectiveness of inherited redundancy and configurability utilization is demonstrated through extensive parametric simulations |
| doi_str_mv | 10.1109/DFT.2006.37 |
| format | conference_proceeding |
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Various reconfigurable architectures have been proposed based on nanowire crossbar structure as the primitive building block. Unfortunately, high-density systems consisting of nanometer-scale elements are likely to have many imperfections and variations; thus, defect-tolerance is considered as one of the most exigent challenges. In this paper, we evaluate three different logic mapping algorithms with defect avoidance to circumvent clustered defective crosspoints in nanowire reconfigurable crossbar architectures. The effectiveness of inherited redundancy and configurability utilization is demonstrated through extensive parametric simulations</abstract><pub>IEEE</pub><doi>10.1109/DFT.2006.37</doi><tpages>9</tpages></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | ISSN: 1550-5774 |
| ispartof | 2006 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2006, p.98-106 |
| issn | 1550-5774 2377-7966 |
| language | eng |
| recordid | cdi_ieee_primary_4030920 |
| source | IEEE Electronic Library (IEL) Conference Proceedings |
| subjects | Assembly systems Circuit testing Clustering algorithms Computer architecture Lithography Logic devices Nanoscale devices Nanostructures Reconfigurable logic Wires |
| title | Inherited Redundancy and Configurability Utilization for Repairing Nanowire Crossbars with Clustered Defects |
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