Step-edge and stacked-heterostructure high-T/sub c/ Josephson junctions for voltage-standard arrays

We have explored two high-transition-temperature Josephson junction technologies for application in voltage standard arrays: step-edge junctions made with YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// and Au normal-metal bridges, and stacked series arrays of Josephson junctions in selectively doped, epita...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 1995-06, Vol.5 (2), p.2915-2918
Main Authors: Benz, S.P., Reintsema, C.D., Ono, R.H., Eckstein, J.N., Bozovic, I., Virshup, G.F.
Format: Article
Language:English
Subjects:
Artificial intelligence
Capacitance
Critical current
Frequency
Gold
Josephson junctions
NIST
Superconducting devices
Temperature
Voltage
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Summary:We have explored two high-transition-temperature Josephson junction technologies for application in voltage standard arrays: step-edge junctions made with YBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// and Au normal-metal bridges, and stacked series arrays of Josephson junctions in selectively doped, epitaxially grown Bi/sub 2/Sr/sub 2/CaCu/sub 2/O/sub 8/ heterostructures. For both kinds of junctions, Shapiro steps induced by a microwave bias were characterized as a function of power. We compare the technologies with respect to critical current and normal resistance uniformity, maximum achievable critical current, critical-current normal-resistance product, and operating temperature.< >
ISSN:1051-8223
1558-2515
DOI:10.1109/77.403202