Single Event Transients (SETs) in the RH108 Operational Amplifier in Analog Circuits

The effects of various commercial power devices are presented. The devices have proved to be very fragile to single event effects, with some of the devices actually succumbing to catastrophic SEE with protons

Saved in:
Bibliographic Details
Main Authors: Chavez, R.M., Scheick, L.Z., Miyahira, T.F., Johnston, A.H.
Format: Conference Proceeding
Language:English
Subjects:
Analog circuits
BJT
Circuit testing
heavy ions
IGBT
Laboratories
NASA
Operational amplifiers
Propulsion
Protons
radiation
Regulators
Space technology
switch
transistor
Voltage
Online Access:Request full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The effects of various commercial power devices are presented. The devices have proved to be very fragile to single event effects, with some of the devices actually succumbing to catastrophic SEE with protons
ISSN:2154-0519
2154-0535
DOI:10.1109/REDW.2006.295485