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High Temperature Coaxial Line Measurement Cell using Room Temperature Calibration
This paper describes another use of the coaxial line technique for the measurement of the permittivity and permeability of magnetic and dielectric materials at elevated temperatures. The proposed modified coaxial measurement cell allows making fast and accurate broadband measurements taking advantag...
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creator | Le Gallou, J.H. Ledieu, M. Acher, O. |
description | This paper describes another use of the coaxial line technique for the measurement of the permittivity and permeability of magnetic and dielectric materials at elevated temperatures. The proposed modified coaxial measurement cell allows making fast and accurate broadband measurements taking advantage of a single room-temperature calibration. Measurements are performed from 50 MHz up to 20 GHz. The new coaxial cell is experimentally validated. Results for glass and ferrite samples, in the 20-300 degC temperature range, are presented |
doi_str_mv | 10.1109/CPEM.2004.305316 |
format | conference_proceeding |
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The proposed modified coaxial measurement cell allows making fast and accurate broadband measurements taking advantage of a single room-temperature calibration. Measurements are performed from 50 MHz up to 20 GHz. The new coaxial cell is experimentally validated. Results for glass and ferrite samples, in the 20-300 degC temperature range, are presented</description><identifier>ISBN: 0780384938</identifier><identifier>ISBN: 9780780384934</identifier><identifier>EISBN: 9780780384941</identifier><identifier>EISBN: 0780384946</identifier><identifier>DOI: 10.1109/CPEM.2004.305316</identifier><language>eng</language><publisher>IEEE</publisher><subject>Calibration ; Coaxial components ; Dielectric materials ; Dielectric measurements ; Ferrites ; Glass ; Performance evaluation ; Permeability measurement ; Permittivity measurement ; Temperature measurement</subject><ispartof>2004 Conference on Precision Electromagnetic Measurements, 2004, p.473-474</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4097327$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4097327$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Le Gallou, J.H.</creatorcontrib><creatorcontrib>Ledieu, M.</creatorcontrib><creatorcontrib>Acher, O.</creatorcontrib><title>High Temperature Coaxial Line Measurement Cell using Room Temperature Calibration</title><title>2004 Conference on Precision Electromagnetic Measurements</title><addtitle>CPEM</addtitle><description>This paper describes another use of the coaxial line technique for the measurement of the permittivity and permeability of magnetic and dielectric materials at elevated temperatures. The proposed modified coaxial measurement cell allows making fast and accurate broadband measurements taking advantage of a single room-temperature calibration. Measurements are performed from 50 MHz up to 20 GHz. The new coaxial cell is experimentally validated. Results for glass and ferrite samples, in the 20-300 degC temperature range, are presented</description><subject>Calibration</subject><subject>Coaxial components</subject><subject>Dielectric materials</subject><subject>Dielectric measurements</subject><subject>Ferrites</subject><subject>Glass</subject><subject>Performance evaluation</subject><subject>Permeability measurement</subject><subject>Permittivity measurement</subject><subject>Temperature measurement</subject><isbn>0780384938</isbn><isbn>9780780384934</isbn><isbn>9780780384941</isbn><isbn>0780384946</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2004</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpVTMlKxEAUbBFBHXMXvPQPJL7e00cJoyNkcCH34SV5GVuyDEkG9O8NjB4sCmqBKsZuBSRCgL_PXtfbRALoRIFRwp6xyLsUFqpUey3O2fVfUOkli6bpExZoo4W3V-xtE_YfvKDuQCPOx5F4NuBXwJbnoSe-JZyWsqN-5hm1LT9Ood_z92Ho_o-wDeXiw9DfsIsG24miX12x4nFdZJs4f3l6zh7yOHiYYycradCUxpR1asiAghIb5evKIrjSutqAc1Y0FlKspSob7WrhpbRVY9EItWJ3p9tARLvDGDocv3cavFPSqR8fC0_w</recordid><startdate>200406</startdate><enddate>200406</enddate><creator>Le Gallou, J.H.</creator><creator>Ledieu, M.</creator><creator>Acher, O.</creator><general>IEEE</general><scope>6IE</scope><scope>6IH</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIO</scope></search><sort><creationdate>200406</creationdate><title>High Temperature Coaxial Line Measurement Cell using Room Temperature Calibration</title><author>Le Gallou, J.H. ; Ledieu, M. ; Acher, O.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-72c25a5b55bd85e5030baf39dc6a07b67d507761f608ad23bf47d19226cf6a513</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2004</creationdate><topic>Calibration</topic><topic>Coaxial components</topic><topic>Dielectric materials</topic><topic>Dielectric measurements</topic><topic>Ferrites</topic><topic>Glass</topic><topic>Performance evaluation</topic><topic>Permeability measurement</topic><topic>Permittivity measurement</topic><topic>Temperature measurement</topic><toplevel>online_resources</toplevel><creatorcontrib>Le Gallou, J.H.</creatorcontrib><creatorcontrib>Ledieu, M.</creatorcontrib><creatorcontrib>Acher, O.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan (POP) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library (IEL)</collection><collection>IEEE Proceedings Order Plans (POP) 1998-present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Le Gallou, J.H.</au><au>Ledieu, M.</au><au>Acher, O.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>High Temperature Coaxial Line Measurement Cell using Room Temperature Calibration</atitle><btitle>2004 Conference on Precision Electromagnetic Measurements</btitle><stitle>CPEM</stitle><date>2004-06</date><risdate>2004</risdate><spage>473</spage><epage>474</epage><pages>473-474</pages><isbn>0780384938</isbn><isbn>9780780384934</isbn><eisbn>9780780384941</eisbn><eisbn>0780384946</eisbn><abstract>This paper describes another use of the coaxial line technique for the measurement of the permittivity and permeability of magnetic and dielectric materials at elevated temperatures. The proposed modified coaxial measurement cell allows making fast and accurate broadband measurements taking advantage of a single room-temperature calibration. Measurements are performed from 50 MHz up to 20 GHz. The new coaxial cell is experimentally validated. Results for glass and ferrite samples, in the 20-300 degC temperature range, are presented</abstract><pub>IEEE</pub><doi>10.1109/CPEM.2004.305316</doi><tpages>2</tpages></addata></record> |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Calibration Coaxial components Dielectric materials Dielectric measurements Ferrites Glass Performance evaluation Permeability measurement Permittivity measurement Temperature measurement |
title | High Temperature Coaxial Line Measurement Cell using Room Temperature Calibration |
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