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Analysis of Different DGS Configurations in Terms of Microstrip Discontinuities
Defected ground structure (DGS) has been analysed in terms of various microstrip discontinuities (quasi static approach). It has been shown that the junction capacitance plays an equally important role in determining the position of attenuation pole of the unit cell DGS as the gap capacitance. Theor...
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creator | Roy, S.M. Karmakar, N.C. |
description | Defected ground structure (DGS) has been analysed in terms of various microstrip discontinuities (quasi static approach). It has been shown that the junction capacitance plays an equally important role in determining the position of attenuation pole of the unit cell DGS as the gap capacitance. Theory is validated against simulation results by commercially available MoM Solver CST design environment. Good agreements between simulated and calculated results validate the theory. |
doi_str_mv | 10.1109/ICECE.2006.355689 |
format | conference_proceeding |
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It has been shown that the junction capacitance plays an equally important role in determining the position of attenuation pole of the unit cell DGS as the gap capacitance. Theory is validated against simulation results by commercially available MoM Solver CST design environment. Good agreements between simulated and calculated results validate the theory.</description><identifier>ISBN: 9843238141</identifier><identifier>ISBN: 9789843238146</identifier><identifier>DOI: 10.1109/ICECE.2006.355689</identifier><language>eng</language><publisher>IEEE</publisher><subject>Arm ; Attenuation ; Band pass filters ; Capacitance ; Current distribution ; Equivalent circuits ; Frequency response ; Microstrip components ; RLC circuits</subject><ispartof>2006 International Conference on Electrical and Computer Engineering, 2006, p.544-547</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4178525$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,776,780,785,786,2052,27902,54895</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4178525$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Roy, S.M.</creatorcontrib><creatorcontrib>Karmakar, N.C.</creatorcontrib><title>Analysis of Different DGS Configurations in Terms of Microstrip Discontinuities</title><title>2006 International Conference on Electrical and Computer Engineering</title><addtitle>ICECE</addtitle><description>Defected ground structure (DGS) has been analysed in terms of various microstrip discontinuities (quasi static approach). It has been shown that the junction capacitance plays an equally important role in determining the position of attenuation pole of the unit cell DGS as the gap capacitance. Theory is validated against simulation results by commercially available MoM Solver CST design environment. Good agreements between simulated and calculated results validate the theory.</description><subject>Arm</subject><subject>Attenuation</subject><subject>Band pass filters</subject><subject>Capacitance</subject><subject>Current distribution</subject><subject>Equivalent circuits</subject><subject>Frequency response</subject><subject>Microstrip components</subject><subject>RLC circuits</subject><isbn>9843238141</isbn><isbn>9789843238146</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2006</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNotj81KAzEYRQMiqLUPIG7yAjPmd5Isy3SshUoX1nVJMol80mZKki769hb1bu7m3AMXoSdKWkqJeVn3Qz-0jJCu5VJ22tygB6MFZ1xTQe_QvJRvcg03ouPmHm0XyR4uBQqeIl5CjCGHVPFy9YH7KUX4OmdbYUoFQ8K7kI-_4Dv4PJWa4XTdFD-lCukMFUJ5RLfRHkqY__cMfb4Ou_6t2WxX636xaYAqWRsXvTaWj3x0jDsmqBmF9c4HT0hQwQgprnes8FFZ6jqltYm0c0L5ICjThs_Q858XQgj7U4ajzZe9oEpLJvkPLsdNoA</recordid><startdate>200612</startdate><enddate>200612</enddate><creator>Roy, S.M.</creator><creator>Karmakar, N.C.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200612</creationdate><title>Analysis of Different DGS Configurations in Terms of Microstrip Discontinuities</title><author>Roy, S.M. ; Karmakar, N.C.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i175t-bfc89a3d3db23b2419d4acbcec00e7e9454110a4cf7a1b67889f16b47ce412893</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2006</creationdate><topic>Arm</topic><topic>Attenuation</topic><topic>Band pass filters</topic><topic>Capacitance</topic><topic>Current distribution</topic><topic>Equivalent circuits</topic><topic>Frequency response</topic><topic>Microstrip components</topic><topic>RLC circuits</topic><toplevel>online_resources</toplevel><creatorcontrib>Roy, S.M.</creatorcontrib><creatorcontrib>Karmakar, N.C.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE/IET Electronic Library</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Roy, S.M.</au><au>Karmakar, N.C.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Analysis of Different DGS Configurations in Terms of Microstrip Discontinuities</atitle><btitle>2006 International Conference on Electrical and Computer Engineering</btitle><stitle>ICECE</stitle><date>2006-12</date><risdate>2006</risdate><spage>544</spage><epage>547</epage><pages>544-547</pages><isbn>9843238141</isbn><isbn>9789843238146</isbn><abstract>Defected ground structure (DGS) has been analysed in terms of various microstrip discontinuities (quasi static approach). It has been shown that the junction capacitance plays an equally important role in determining the position of attenuation pole of the unit cell DGS as the gap capacitance. Theory is validated against simulation results by commercially available MoM Solver CST design environment. Good agreements between simulated and calculated results validate the theory.</abstract><pub>IEEE</pub><doi>10.1109/ICECE.2006.355689</doi><tpages>4</tpages></addata></record> |
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language | eng |
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source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Arm Attenuation Band pass filters Capacitance Current distribution Equivalent circuits Frequency response Microstrip components RLC circuits |
title | Analysis of Different DGS Configurations in Terms of Microstrip Discontinuities |
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