Some Failure Mechanisms at Insulator-Conductor Junctions

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Bibliographic Details
Main Authors: Shirn, G. A., Smyth, D. M.
Format: Conference Proceeding
Language:English
Subjects:
Capacitors
Chemicals
Conductivity
Degradation
Dielectric materials
Dielectrics and electrical insulation
Electrodes
Failure analysis
Solids
Temperature
Online Access:Request full text
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ISSN:0097-2088
DOI:10.1109/IRPS.1963.362243