Dielectric Losses in SiC at Millimeter Wavelengths

Dielectric loss measurements were performed on high purity semi-insulating SiC wafers of various grades. Analysis of experimental data would provide insight into the nature of loss mechanisms in this material and into its potential as an alternate material for gyrotron window applications. Experimen...

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Bibliographic Details
Main Authors: Dutta, J.M., Guofen Yu, Jones, C.R.
Format: Conference Proceeding
Language:English
Subjects:
Data analysis
Dielectric loss measurement
Dielectric losses
Dielectric materials
Dielectric measurements
Loss measurement
Millimeter wave measurements
Performance evaluation
Silicon carbide
Wavelength measurement
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Description
Summary:Dielectric loss measurements were performed on high purity semi-insulating SiC wafers of various grades. Analysis of experimental data would provide insight into the nature of loss mechanisms in this material and into its potential as an alternate material for gyrotron window applications. Experimental results will be presented.
ISSN:2162-2027
DOI:10.1109/ICIMW.2006.368619