Thickness Determination for Homogeneous Dielectric Materials through THz-TDS

Through the use of terahertz time-domain spectroscopy (THz-TDS), the sample thickness can be determined by exploiting the Fabry-Perot effect. Given the reference pulse and the full-scanned sample pulse traversing a homogeneous dielectric material with a known index of refraction, the method calculat...

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Bibliographic Details
Main Authors: Withayachumnankul, W., Fischer, B.M., Mickan, S.P., Abbott, D.
Format: Conference Proceeding
Language:English
Subjects:
Dielectric materials
Fabry-Perot
Frequency
Optical noise
Optical pulses
Optical refraction
Silicon
Time domain analysis
Transfer functions
Ultrafast optics
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Summary:Through the use of terahertz time-domain spectroscopy (THz-TDS), the sample thickness can be determined by exploiting the Fabry-Perot effect. Given the reference pulse and the full-scanned sample pulse traversing a homogeneous dielectric material with a known index of refraction, the method calculates the thickness from the fringe pattern, i.e. the maxima and minima, appearing in the transmission amplitude spectrum. High accuracy is attainable when a material has a constant index of refraction and low loss across the T-ray frequency region. This paper demonstrates results using silicon and cycloolefines as test material.
ISSN:2162-2027
DOI:10.1109/ICIMW.2006.368656