Imaging of Microscopic Sources of Resistive and Reactive Nonlinearities in Superconducting Microwave Devices

The technique of low-temperature laser scanning microscopy (LSM) has been applied to the investigation of local microwave properties in operating YBa 2 Cu 3 O 7 /LaAlO 3 thin-film resonators patterned into a meandering strip transmission line. By using a modified newly developed procedure of spatial...

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Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2007-06, Vol.17 (2), p.902-905
Main Authors: Zhuravel, A.P., Anlage, S.M., Ustinov, A.V.
Format: Article
Language:English
Subjects:
AGING MECHANISMS
Applied sciences
Circuit properties
COPPER OXIDE
Devices
Electric, optical and optoelectronic circuits
ELECTRICAL CONDUCTIVITY
Electronic circuits
Electronic equipment and fabrication. Passive components, printed wiring boards, connectics
ELECTRONIC PRODUCTS
Electronics
Exact sciences and technology
High- {\rm T}_{\rm c} superconductors
Intermodulation
laser scanning microscopy
LASERS
Masers
MICROSCOPY
Microwave and submillimeter wave devices, electron transfer devices
microwave devices
Microwave imaging
Microwave theory and techniques
MICROWAVES
Nonlinearity
Oscillators, resonators, synthetizers
Planar transmission lines
Semiconductor electronics. Microelectronics. Optoelectronics. Solid state devices
Strips
Superconducting devices
Superconducting microwave devices
Superconducting thin films
Superconducting transmission lines
SUPERCONDUCTIVITY
SUPERCONDUCTORS
THIN FILMS
Two dimensional
YBCO superconductors
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Description
Summary:The technique of low-temperature laser scanning microscopy (LSM) has been applied to the investigation of local microwave properties in operating YBa 2 Cu 3 O 7 /LaAlO 3 thin-film resonators patterned into a meandering strip transmission line. By using a modified newly developed procedure of spatially-resolved complex impedance partition, the influence of inhomogeneous current flow on the formation of nonlinear (NL) microwave response in such planar devices is analysed in terms of the independent impact from resistive and inductive components. The modified procedure developed here is dramatically faster than our previous method. The LSM capability to probe the spatial variations of two-tone, third-order intermodulation photoresponse on micron length scales is used to find the 2D distribution of the local sources of microwave NL. The results show that the dominant sources of microwave NL are strongly localized in the resistive domains.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2007.897322