Characterization of Phase Evolution in YBCO Coated Conductors Produced by the Ex Situ Process

Raman microprobe spectroscopy and scanning electron microscopy were used to study the initial nucleation and growth of YBCO in thick precursors by the BaF 2 ex situ process. For quenched films of 2 mum thickness, the data indicate a low density of c-axis nuclei near the substrate, apparently due to...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on applied superconductivity 2007-06, Vol.17 (2), p.3254-3258
Main Authors: Feenstra, R., List, F.A., Zhang, Y., Christen, D.K., Maroni, V.A., Miller, D.J., Feldmann, D.M.
Format: Article
Language:English
Subjects:
Annealing
Atherosclerosis
Conductors
High-temperature superconductors
Raman scattering
Raman spectroscopy
Scanning electron microscopy
Solvents
Spectroscopy
Substrates
superconducting epitaxial layers
Thick films
Yttrium barium copper oxide
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:Raman microprobe spectroscopy and scanning electron microscopy were used to study the initial nucleation and growth of YBCO in thick precursors by the BaF 2 ex situ process. For quenched films of 2 mum thickness, the data indicate a low density of c-axis nuclei near the substrate, apparently due to a reduced oxygen concentration deep inside the precursor layer. Significant non c-axis growth was also observed; the majority of this material nucleates away from the substrate. Measurement of the conversion rate by in situ XRD for films in the range 0.2-2 mum suggest a weak thickness dependence.
ISSN:1051-8223
1558-2515
DOI:10.1109/TASC.2007.899994