Modeling of Ionic Conductivity Dielectric with Non-uniform Blocking Surface

The one-dimensional model of ionic conductivity in dielectric layers with a non-uniform blocking surface of the semiconductor with specified geometrical horizontal structure is developed. The model is based on the results of research of a relaxation of ions in dielectric on polycrystalline silicon a...

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Bibliographic Details
Main Authors: Perov, G.V., Shauerman, A.A.
Format: Conference Proceeding
Language:English
Subjects:
Conductive films
Conductivity
Dielectrics
Helium
Polarization
Predictive models
Rough surfaces
Silicon
Solid modeling
Surface roughness
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Description
Summary:The one-dimensional model of ionic conductivity in dielectric layers with a non-uniform blocking surface of the semiconductor with specified geometrical horizontal structure is developed. The model is based on the results of research of a relaxation of ions in dielectric on polycrystalline silicon and allows predicting behavior of ions depending on a roughness of border.
ISSN:1815-3712
DOI:10.1109/SIBEDM.2007.4292935