Loading…
Macroporous Silicon Infiltrated with Liquid Crystals: Director-Field Configuration and Device Applications
We present the simulated distribution of the local director of nematic liquid crystal (NLC) which is confined inside cylindrical macropores of the porous silicon. The Frank free energy approach is used to describe the NLC in porous medium. The influence of molecular anchoring strength and external e...
Saved in:
Main Authors: | , , , , |
---|---|
Format: | Conference Proceeding |
Language: | English |
Subjects: | |
Online Access: | Request full text |
Tags: |
Add Tag
No Tags, Be the first to tag this record!
|
cited_by | |
---|---|
cites | |
container_end_page | 49 |
container_issue | |
container_start_page | 46 |
container_title | |
container_volume | |
creator | Dyomin, A.A. Tkachenko, G.V. Tkachenko, V. Sukhoivanov, I.A. Abbate, G. |
description | We present the simulated distribution of the local director of nematic liquid crystal (NLC) which is confined inside cylindrical macropores of the porous silicon. The Frank free energy approach is used to describe the NLC in porous medium. The influence of molecular anchoring strength and external electric field applied is investigated. Bruggeman approximation is used while calculating effective refractive index of each layer in porous silicon multilayer structure. Reflectivity spectrum of the latter is simulated using transfer matrix approach. Electrical tuning range of microcavity designed for resonance at 1330 nm vary from 8.5 nm up to 16 nm for weak and strong surface anchoring conditions respectively. |
doi_str_mv | 10.1109/OPT.2007.4298521 |
format | conference_proceeding |
fullrecord | <record><control><sourceid>ieee_6IE</sourceid><recordid>TN_cdi_ieee_primary_4298521</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><ieee_id>4298521</ieee_id><sourcerecordid>4298521</sourcerecordid><originalsourceid>FETCH-LOGICAL-i90t-fd8ed81d5c16085d1d25785b47b5629b6144905b00b03f80f7f7ad2080c56efa3</originalsourceid><addsrcrecordid>eNpVkLFOwzAQho0QEqh0R2LxCyScHTux2aqUQqWiItG9cmIbrgpNcFxQ3x4LunDL6f5f3zccITcMcsZA361fNjkHqHLBtZKcnZGprhQTXAhWcC7P_91MXZLpOO4gTaGlVsUV2T2bNvRDH_rDSF-xw7bf0-XeYxeDic7Sb4zvdIWfB7S0Dscxmm68p3MMro19yBboulT0iXg7JAITbvaWzt0Xto7OhiEpf-Pxmlz4BLvpaU_IZvGwqZ-y1fpxWc9WGWqImbfKWcWsbFkJSlpmuayUbETVyJLrpmRCaJANQAOFV-ArXxnLQUErS-dNMSG3f1p0zm2HgB8mHLenBxU_2k1aKw</addsrcrecordid><sourcetype>Publisher</sourcetype><iscdi>true</iscdi><recordtype>conference_proceeding</recordtype></control><display><type>conference_proceeding</type><title>Macroporous Silicon Infiltrated with Liquid Crystals: Director-Field Configuration and Device Applications</title><source>IEEE Electronic Library (IEL) Conference Proceedings</source><creator>Dyomin, A.A. ; Tkachenko, G.V. ; Tkachenko, V. ; Sukhoivanov, I.A. ; Abbate, G.</creator><creatorcontrib>Dyomin, A.A. ; Tkachenko, G.V. ; Tkachenko, V. ; Sukhoivanov, I.A. ; Abbate, G.</creatorcontrib><description>We present the simulated distribution of the local director of nematic liquid crystal (NLC) which is confined inside cylindrical macropores of the porous silicon. The Frank free energy approach is used to describe the NLC in porous medium. The influence of molecular anchoring strength and external electric field applied is investigated. Bruggeman approximation is used while calculating effective refractive index of each layer in porous silicon multilayer structure. Reflectivity spectrum of the latter is simulated using transfer matrix approach. Electrical tuning range of microcavity designed for resonance at 1330 nm vary from 8.5 nm up to 16 nm for weak and strong surface anchoring conditions respectively.</description><identifier>ISBN: 9781424413218</identifier><identifier>ISBN: 1424413214</identifier><identifier>EISBN: 9781424413225</identifier><identifier>EISBN: 1424413222</identifier><identifier>DOI: 10.1109/OPT.2007.4298521</identifier><language>eng</language><publisher>IEEE</publisher><subject>Etching ; Liquid crystal devices ; Liquid crystals ; Microcavities ; Optical refraction ; Optical sensors ; Optical surface waves ; Silicon ; Surface morphology ; Tuning</subject><ispartof>2007 International Workshop on Optoelectronic Physics and Technology, 2007, p.46-49</ispartof><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://ieeexplore.ieee.org/document/4298521$$EHTML$$P50$$Gieee$$H</linktohtml><link.rule.ids>309,310,780,784,789,790,2058,27925,54920</link.rule.ids><linktorsrc>$$Uhttps://ieeexplore.ieee.org/document/4298521$$EView_record_in_IEEE$$FView_record_in_$$GIEEE</linktorsrc></links><search><creatorcontrib>Dyomin, A.A.</creatorcontrib><creatorcontrib>Tkachenko, G.V.</creatorcontrib><creatorcontrib>Tkachenko, V.</creatorcontrib><creatorcontrib>Sukhoivanov, I.A.</creatorcontrib><creatorcontrib>Abbate, G.</creatorcontrib><title>Macroporous Silicon Infiltrated with Liquid Crystals: Director-Field Configuration and Device Applications</title><title>2007 International Workshop on Optoelectronic Physics and Technology</title><addtitle>OPT</addtitle><description>We present the simulated distribution of the local director of nematic liquid crystal (NLC) which is confined inside cylindrical macropores of the porous silicon. The Frank free energy approach is used to describe the NLC in porous medium. The influence of molecular anchoring strength and external electric field applied is investigated. Bruggeman approximation is used while calculating effective refractive index of each layer in porous silicon multilayer structure. Reflectivity spectrum of the latter is simulated using transfer matrix approach. Electrical tuning range of microcavity designed for resonance at 1330 nm vary from 8.5 nm up to 16 nm for weak and strong surface anchoring conditions respectively.</description><subject>Etching</subject><subject>Liquid crystal devices</subject><subject>Liquid crystals</subject><subject>Microcavities</subject><subject>Optical refraction</subject><subject>Optical sensors</subject><subject>Optical surface waves</subject><subject>Silicon</subject><subject>Surface morphology</subject><subject>Tuning</subject><isbn>9781424413218</isbn><isbn>1424413214</isbn><isbn>9781424413225</isbn><isbn>1424413222</isbn><fulltext>true</fulltext><rsrctype>conference_proceeding</rsrctype><creationdate>2007</creationdate><recordtype>conference_proceeding</recordtype><sourceid>6IE</sourceid><recordid>eNpVkLFOwzAQho0QEqh0R2LxCyScHTux2aqUQqWiItG9cmIbrgpNcFxQ3x4LunDL6f5f3zccITcMcsZA361fNjkHqHLBtZKcnZGprhQTXAhWcC7P_91MXZLpOO4gTaGlVsUV2T2bNvRDH_rDSF-xw7bf0-XeYxeDic7Sb4zvdIWfB7S0Dscxmm68p3MMro19yBboulT0iXg7JAITbvaWzt0Xto7OhiEpf-Pxmlz4BLvpaU_IZvGwqZ-y1fpxWc9WGWqImbfKWcWsbFkJSlpmuayUbETVyJLrpmRCaJANQAOFV-ArXxnLQUErS-dNMSG3f1p0zm2HgB8mHLenBxU_2k1aKw</recordid><startdate>200706</startdate><enddate>200706</enddate><creator>Dyomin, A.A.</creator><creator>Tkachenko, G.V.</creator><creator>Tkachenko, V.</creator><creator>Sukhoivanov, I.A.</creator><creator>Abbate, G.</creator><general>IEEE</general><scope>6IE</scope><scope>6IL</scope><scope>CBEJK</scope><scope>RIE</scope><scope>RIL</scope></search><sort><creationdate>200706</creationdate><title>Macroporous Silicon Infiltrated with Liquid Crystals: Director-Field Configuration and Device Applications</title><author>Dyomin, A.A. ; Tkachenko, G.V. ; Tkachenko, V. ; Sukhoivanov, I.A. ; Abbate, G.</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-LOGICAL-i90t-fd8ed81d5c16085d1d25785b47b5629b6144905b00b03f80f7f7ad2080c56efa3</frbrgroupid><rsrctype>conference_proceedings</rsrctype><prefilter>conference_proceedings</prefilter><language>eng</language><creationdate>2007</creationdate><topic>Etching</topic><topic>Liquid crystal devices</topic><topic>Liquid crystals</topic><topic>Microcavities</topic><topic>Optical refraction</topic><topic>Optical sensors</topic><topic>Optical surface waves</topic><topic>Silicon</topic><topic>Surface morphology</topic><topic>Tuning</topic><toplevel>online_resources</toplevel><creatorcontrib>Dyomin, A.A.</creatorcontrib><creatorcontrib>Tkachenko, G.V.</creatorcontrib><creatorcontrib>Tkachenko, V.</creatorcontrib><creatorcontrib>Sukhoivanov, I.A.</creatorcontrib><creatorcontrib>Abbate, G.</creatorcontrib><collection>IEEE Electronic Library (IEL) Conference Proceedings</collection><collection>IEEE Proceedings Order Plan All Online (POP All Online) 1998-present by volume</collection><collection>IEEE Xplore All Conference Proceedings</collection><collection>IEEE Electronic Library Online</collection><collection>IEEE Proceedings Order Plans (POP All) 1998-Present</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Dyomin, A.A.</au><au>Tkachenko, G.V.</au><au>Tkachenko, V.</au><au>Sukhoivanov, I.A.</au><au>Abbate, G.</au><format>book</format><genre>proceeding</genre><ristype>CONF</ristype><atitle>Macroporous Silicon Infiltrated with Liquid Crystals: Director-Field Configuration and Device Applications</atitle><btitle>2007 International Workshop on Optoelectronic Physics and Technology</btitle><stitle>OPT</stitle><date>2007-06</date><risdate>2007</risdate><spage>46</spage><epage>49</epage><pages>46-49</pages><isbn>9781424413218</isbn><isbn>1424413214</isbn><eisbn>9781424413225</eisbn><eisbn>1424413222</eisbn><abstract>We present the simulated distribution of the local director of nematic liquid crystal (NLC) which is confined inside cylindrical macropores of the porous silicon. The Frank free energy approach is used to describe the NLC in porous medium. The influence of molecular anchoring strength and external electric field applied is investigated. Bruggeman approximation is used while calculating effective refractive index of each layer in porous silicon multilayer structure. Reflectivity spectrum of the latter is simulated using transfer matrix approach. Electrical tuning range of microcavity designed for resonance at 1330 nm vary from 8.5 nm up to 16 nm for weak and strong surface anchoring conditions respectively.</abstract><pub>IEEE</pub><doi>10.1109/OPT.2007.4298521</doi><tpages>4</tpages></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | ISBN: 9781424413218 |
ispartof | 2007 International Workshop on Optoelectronic Physics and Technology, 2007, p.46-49 |
issn | |
language | eng |
recordid | cdi_ieee_primary_4298521 |
source | IEEE Electronic Library (IEL) Conference Proceedings |
subjects | Etching Liquid crystal devices Liquid crystals Microcavities Optical refraction Optical sensors Optical surface waves Silicon Surface morphology Tuning |
title | Macroporous Silicon Infiltrated with Liquid Crystals: Director-Field Configuration and Device Applications |
url | http://sfxeu10.hosted.exlibrisgroup.com/loughborough?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-24T12%3A22%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-ieee_6IE&rft_val_fmt=info:ofi/fmt:kev:mtx:book&rft.genre=proceeding&rft.atitle=Macroporous%20Silicon%20Infiltrated%20with%20Liquid%20Crystals:%20Director-Field%20Configuration%20and%20Device%20Applications&rft.btitle=2007%20International%20Workshop%20on%20Optoelectronic%20Physics%20and%20Technology&rft.au=Dyomin,%20A.A.&rft.date=2007-06&rft.spage=46&rft.epage=49&rft.pages=46-49&rft.isbn=9781424413218&rft.isbn_list=1424413214&rft_id=info:doi/10.1109/OPT.2007.4298521&rft.eisbn=9781424413225&rft.eisbn_list=1424413222&rft_dat=%3Cieee_6IE%3E4298521%3C/ieee_6IE%3E%3Cgrp_id%3Ecdi_FETCH-LOGICAL-i90t-fd8ed81d5c16085d1d25785b47b5629b6144905b00b03f80f7f7ad2080c56efa3%3C/grp_id%3E%3Coa%3E%3C/oa%3E%3Curl%3E%3C/url%3E&rft_id=info:oai/&rft_id=info:pmid/&rft_ieee_id=4298521&rfr_iscdi=true |