Modelling of a Mixed Signal Processor Susceptibility to Near-Field Aggression

This paper deals with measurement and modelling of the susceptibility of an integrated analog to digital converter of a 16 bit microcontroller to near-field localized aggression using a miniature near-field probe. A predictive simulation of the susceptibility threshold is detailed comparison between...

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Bibliographic Details
Main Authors: Boyer, A., Bendhia, S., Sicard, E.
Format: Conference Proceeding
Language:English
Subjects:
Analog integrated circuits
Analog-digital conversion
Circuit simulation
Digital integrated circuits
Integrated circuit measurements
Microcontrollers
Predictive models
Probes
Signal processing
Testing
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Description
Summary:This paper deals with measurement and modelling of the susceptibility of an integrated analog to digital converter of a 16 bit microcontroller to near-field localized aggression using a miniature near-field probe. A predictive simulation of the susceptibility threshold is detailed comparison between experimental and simulation results shows interesting correlations between measured and simulated susceptibility thresholds.
ISSN:2158-110X
2158-1118
DOI:10.1109/ISEMC.2007.209