Degradation Analysis of 2- \mu\hbox DFB Laser Using Optical Beam-Induced Current Technique

The degradation behavior of 2-mum wavelength distributed feedback lasers with a p- and n-type InP buried heterostructure during constant-power aging is investigated. The degradation mechanism is governed by diffused defects with a parallel direction in the crystal plane. Furthermore, it is clarified...

Full description

Saved in:
Bibliographic Details
Published in:IEEE transactions on electron devices 2007-10, Vol.54 (10), p.2644-2649
Main Authors: Takeshita, T., Sato, T., Mitsuhara, M., Kondo, Y., Sugo, M., Kato, K.
Format: Article
Language:English
Subjects:
Aging
Degradation
failure analysis
Gas lasers
indium compounds
Indium phosphide
Laser applications
Laser modes
laser reliability
Lasers
photon beams
quantum well lasers
semiconductor lasers
Citations: Items that this one cites
Items that cite this one
Online Access:Get full text
Tags: Add Tag
No Tags, Be the first to tag this record!
Description
Summary:The degradation behavior of 2-mum wavelength distributed feedback lasers with a p- and n-type InP buried heterostructure during constant-power aging is investigated. The degradation mechanism is governed by diffused defects with a parallel direction in the crystal plane. Furthermore, it is clarified that the epitaxial layers on the mesa affect both first- and second-stage degradations.
ISSN:0018-9383
1557-9646
DOI:10.1109/TED.2007.904961