Degradation Analysis of 2- \mu\hbox DFB Laser Using Optical Beam-Induced Current Technique

The degradation behavior of 2-mum wavelength distributed feedback lasers with a p- and n-type InP buried heterostructure during constant-power aging is investigated. The degradation mechanism is governed by diffused defects with a parallel direction in the crystal plane. Furthermore, it is clarified...

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Published in:IEEE transactions on electron devices 2007-10, Vol.54 (10), p.2644-2649
Main Authors: Takeshita, T., Sato, T., Mitsuhara, M., Kondo, Y., Sugo, M., Kato, K.
Format: Article
Language:English
Subjects:
Aging
Degradation
failure analysis
Gas lasers
indium compounds
Indium phosphide
Laser applications
Laser modes
laser reliability
Lasers
photon beams
quantum well lasers
semiconductor lasers
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cited_by cdi_FETCH-LOGICAL-c1060-5b579ae8c0d834aefef406f26a8883ebe8ba493287d3e2f7f56c9edf86fdcae73
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creator Takeshita, T.
Sato, T.
Mitsuhara, M.
Kondo, Y.
Sugo, M.
Kato, K.
description The degradation behavior of 2-mum wavelength distributed feedback lasers with a p- and n-type InP buried heterostructure during constant-power aging is investigated. The degradation mechanism is governed by diffused defects with a parallel direction in the crystal plane. Furthermore, it is clarified that the epitaxial layers on the mesa affect both first- and second-stage degradations.
doi_str_mv 10.1109/TED.2007.904961
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subjects Aging
Degradation
failure analysis
Gas lasers
indium compounds
Indium phosphide
Laser applications
Laser modes
laser reliability
Lasers
photon beams
quantum well lasers
semiconductor lasers
title Degradation Analysis of 2- \mu\hbox DFB Laser Using Optical Beam-Induced Current Technique
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