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The Characteristics of an Ultra-High Resolution Ge(Li) Spectrometer for Singles and Coincidence X-Ray and Gamma-Ray Studies
The use of an ultra-high resolution Ge(Li) photon spectrometer in low and high energy X-ray and gamma-ray measurements has been evaluated. Studies were made of the resolution, low energy cutoff, the full energy and K X-ray escape efficiencies, tha effective detector dead layer and the detector linea...
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Published in: | IEEE transactions on nuclear science 1969, Vol.16 (1), p.36-46 |
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Main Authors: | , , |
Format: | Article |
Language: | English |
Subjects: | |
Citations: | Items that this one cites Items that cite this one |
Online Access: | Get full text |
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Summary: | The use of an ultra-high resolution Ge(Li) photon spectrometer in low and high energy X-ray and gamma-ray measurements has been evaluated. Studies were made of the resolution, low energy cutoff, the full energy and K X-ray escape efficiencies, tha effective detector dead layer and the detector linearity. The detector was used simultaneously with a high resolution Si(Li) detector to measure fast coincidences between Ka1 , Ka2 and L X-rays, as well as coincidences between K, L conversion electrons and L X-rays. A detailed discussion is presented of the electronic problems associated with making these kind of measurements. Measurements were also made of X-ray beams produced by clinical X-ray machines at 40, 78 and 220 kV. |
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ISSN: | 0018-9499 1558-1578 |
DOI: | 10.1109/TNS.1969.4325079 |