Performance of the Signal Processing System for the Time Projection Chamber

The Time Projection Chamber has operated in the PEP colliding beams at SLAC since January 1982. Its signal processing system, containing 16020 channels, has been calibrated and monitored using a computer-controlled test pulser system. We describe the test system and review measurements made with the...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 1983-01, Vol.30 (1), p.162-166
Main Authors: Loken, Stewart C., Aihara, H., Alston-Garnjost, M., Badtke, D. H., Bakken, J. A., Barbaro-Galtieri, A., Barnes, A. V., Barnett, B. A., Blumenfeld, B., Bross, A., Buchanan, C. D., Carithers, W. C., Chamberlain, O., Chiba, J., Chien, C-Y., Clark, A. R., Dahl, O. I., Day, C. T., Delpierre, P., Derby, K. A., Eberhard, P. H., Fancher, D. L., Fujii, H., Fujii, T., Gabioud, B., Gary, J. W., Gorn, W., Hadley, N. J., Hauptman, J. M., Heck, B., Hilke, H., Huth, J. E., Hylen, J., Iwasaki, H., Kamae, T., Kenney, R. W., Kerth, L. T., Koda, R., Kofler, R. R., Kwong, K. K., Layter, J. G., Lindsey, C. S., Loken, S. C., Lu, X-Q., Lynch, G. R., Madansky, L., Madaras, R. J., Majka, R., Mallet, J., Martin, P. S., Maruyama, K., Marx, J. N., Matthews, J. A. J., Melnikoff, S. O., Moses, W., Nemethy, P., Nygren, D. R., Oddone, P. J., Park, D., Pevsner, A., Pripstein, M., Robrish, P. R., Ronan, M. T., Ross, R. R., Rouse, F. R., Shapiro, G., Shapiro, M. D., Shen, B. C., Slater, W. E., Stevenson, M. L., Stork, D. H., Ticho, H. K., Toge, N., Urban, M., Van Dalen, G. J., van Tyen, R., Videau, H., Wayne, M., Wenzel, W. A., vanDaalen Wetters, R. F., Yamauchi, M., Zeller, M. E., Zhang, W-M.
Format: Article
Language:English
Subjects:
Computerized monitoring
Detectors
Electronic equipment testing
Ionization
Physics
Signal processing
Spatial resolution
System testing
Timing
Wires
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Summary:The Time Projection Chamber has operated in the PEP colliding beams at SLAC since January 1982. Its signal processing system, containing 16020 channels, has been calibrated and monitored using a computer-controlled test pulser system. We describe the test system and review measurements made with the system of signal processing electronics.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.1983.4332243