A New Class of Single Event Soft Errors

A new class of single event transient errors, referred to here as "single event disturb errors", is described. These errors are potentially as troublesome as single event upsets. Computer simulations demonstrate that disturb errors have critical charges less than or equal to those for logi...

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Bibliographic Details
Published in:IEEE transactions on nuclear science 1984-01, Vol.31 (6), p.1145-1148
Main Author: Diehl-Nagle, Sherra E.
Format: Article
Language:English
Subjects:
Circuit testing
Computer errors
Computer simulation
Drives
Error correction
Integrated circuit interconnections
Logic
Read-write memory
Resistors
Single event upset
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Description
Summary:A new class of single event transient errors, referred to here as "single event disturb errors", is described. These errors are potentially as troublesome as single event upsets. Computer simulations demonstrate that disturb errors have critical charges less than or equal to those for logic upset in all circuits, and rates approaching those for upset in state-of-the-art sRAM circuits with polysilicon resistor loads. The errors cannot be prevented by resistive decoupling, and elude many current single event error testing methods.
ISSN:0018-9499
1558-1578
DOI:10.1109/TNS.1984.4333472